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발행년	- (예 : 2010-2015)

전체선택

Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal–Ferroelectric–Insulator–Semiconductor Capacitors

Academic Journal

Wu, C.; Ronchi, N.; Wang, K.; Wang, Y.; Mcmitchell, S.; Banerjee, K.; van Den Bosch, G.; van Houdt, J.; Wu, T.

IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 10:109-114 2022

Web of Science JCR 저널정보 Scopus Find it@PNU

Microwave Properties of Ba-Substituted Pb(Zr0.52Ti0.48)O3 after Chemical Mechanical Polishing

Academic Journal

Luciano, F.; De Gendt, S.; Teugels, L.; McMitchell, S.; Talmelli, G.; Guerenneur, A.; Caluwaerts, R.; Conard, T.; Vaesen, I.; Sergeant, S.; Van Dorpe, P.; Swerts, J.; Ciubotaru, F.; Adelmann, C.; Stheins, R.; Dekkers, M.

In: ECS Journal of Solid State Science and Technology. (ECS Journal of Solid State Science and Technology, September 2023, 12(9))

Full Text (IOP) Web of Science JCR 저널정보 Scopus Find it@PNU

Probing the Evolution of Electrically Active Defects in Doped Ferroelectric HfO2 during Wake-Up and Fatigue

Conference

Celano, U.; Chen, Y. H.; Minj, A.; Banerjee, K.; Ronchi, N.; McMitchell, S.; Van Marcke, P.; Favia, P.; Wu, T. L.; Kaczer, B.; Van den Bosch, G.; Van Houdt, J.; van der Heide, P.

2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Full Text (IEEE) Find it@PNU

Ferroelectric La-Doped ZrO2/HfxZr1−xO2 Bilayer Stacks with Enhanced Endurance

Academic Journal

Popovici, M.; Walke, A.M.; Banerjee, K.; Ronchi, N.; Meersschaut, J.; Celano, U.; McMitchell, S.; Spampinato, V.; Franquet, A.; Favia, P.; Swerts, J.; Van den Bosch, G.; Van Houdt, J.

In: Physica Status Solidi - Rapid Research Letters. (Physica Status Solidi - Rapid Research Letters, May 2021, 15(5))

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

Defect profiling in FEFET Si:HfO2layers

Academic Journal

O'sullivan, B.J.; Putcha, V.; Simoen, E.; Jung, T.; Higashi, Y.; Degraeve, R.; Truijen, B.; Kaczer, B.; Ronchi, N.; Mcmitchell, S.; Banerjee, K.; Clima, S.; Breuil, L.; Van Den Bosch, G.; Linten, D.; Van Houdt, J.; Izmailov, R.; Afanas'ev, V.

In: Applied Physics Letters. (Applied Physics Letters, 16 November 2020, 117(20))

Full Text (AIP) Web of Science JCR 저널정보 Scopus Find it@PNU

SrHfTiO high- k films deposited on Si by pulsed laser deposition.

Academic Journal

Yan, L.; Xu, Z.; Grygiel, C.; McMitchell, S.; Suchomel, M.; Bacsa, J.; Clark, J.; Niu, H.; Romani, S.; Palgrave, R.; Chalker, P.; Rosseinsky, M.

Applied Physics A: Materials Science & Processing. Jul2011, Vol. 104 Issue 1, p447-451. 5p. 1 Black and White Photograph, 4 Graphs.

EBSCOHost PDF Full Text (ECC - 개별구독 전자저널) Full Text (Springer-Archive) Web of Science JCR 저널정보 Scopus Find it@PNU

Endurance of ferroelectric La-doped HfO2 for SFS gate-stack memory devices

Conference

Ronchi, N.; McMitchell, S.; Min, J.; Banerjee, K.; Bosch, G.V.D.; Houdt, J.V.; Min, J.; Shin, C.; Min, J.; Houdt, J.V.

In: 2020 IEEE International Memory Workshop, IMW 2020 - Proceedings, 2020 IEEE International Memory Workshop, IMW 2020 - Proceedings. (2020 IEEE International Memory Workshop, IMW 2020 - Proceedings, May 2020)

Full Text (IEEE) Scopus Find it@PNU

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