학술논문
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Academic Journal
In Journal of Heart and Lung Transplantation April 2022 41(4) Supplement:S526-S526
Academic Journal
Kaiser, E.A.; Igdalova, A.; Haggerty, E.B.; Cucchiara, B.L.; Aguirre, G.K.; McAdams, H.; Brainard, D.H.
In: Neurology . (Neurology, 26 October 2021, 97(17):E1672-E1680)
Conference
Udayakumar, K. R.; San, T.; Rodriguez, J.; Chevacharoenkul, S.; Frystak, D.; Rodriguez-Latorre, J.; Zhou, C.; Ball, M.; Ndai, P.; Madan, S.; McAdams, H.; Summerfelt, S.; Moise, T.
2013 5th IEEE International Memory Workshop Memory Workshop (IMW), 2013 5th IEEE International. :128-131 May, 2013
Conference
Eliason, J.; Madan, S.; McAdams, H.; Fox, G.; Moise, T.; Lin, C.; Schwartz, K.; Gallia, J.; Jabillo, E.; Kraus, B.; Summerfelt, S.
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. Custom Integrated Circuits Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005. :427-430 2005
Conference
Rodriguez, J.; Remack, K.; Boku, K.; Udayakumar, K.R.; Aggarwal, S.; Summerfelt, S.; Moise, T.; McAdams, H.; McPherson, J.; Bailey, R.; Depner, M.; Fox, G.
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :200-208 2004
Conference
Moise, T.S.; Summerfelt, S.R.; McAdams, H.; Aggarwal, S.; Udayakumar, K.R.; Celii, F.G.; Martin, J.S.; Xing, G.; Hall, L.; Taylor, K.J.; Hurd, T.; Rodriguez, J.; Remack, K.; Khan, M.D.; Boku, K.; Stacey, G.; Yao, M.; Albrecht, M.G.; Zielinski, E.; Thakre, M.; Kuchimanchi, S.; Thomas, A.; McKee, B.; Rickes, J.; Wang, A.; Grace, J.; Fong, J.; Lee, D.; Pietrzyk, C.; Lanham, R.; Gilbert, S.R.; Taylor, D.; Amano, J.; Bailey, R.; Chu, F.; Fox, G.; Sun, S.; Davenport, T.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :535-538 2002
Conference
Rodriguez, J.; Remack, K.; Gertas, J.; Boku, K.; Udayakumar, K.R.; Summerfelt, S.; Shinn, G.; Madan, S.; Mcadams, H.; Moise, T.; Eliason, J.; Bailey, R.; Depner, M.; Kim, D.; Staubs, P.
2007 Non-Volatile Memory Technology Symposium Non-Volatile Memory Technology Symposium, 2007. NVMTS '07. :64-66 Nov, 2007
Academic Journal
McAdams, H.; Kaiser, E.A.; Igdalova, A.; Haggerty, E.B.; Cucchiara, B.; Aguirre, G.K.; Brainard, D.H.
In: Proceedings of the National Academy of Sciences of the United States of America . (Proceedings of the National Academy of Sciences of the United States of America, 21 July 2020, 117(29):17320-17329)
Academic Journal
Rodriguez, J.A.; Remack, K.; Boku, K.; Udayakumar, K.R.; Aggarwal, S.; Summerfelt, S.R.; Celii, F.G.; Martin, S.; Hall, L.; Taylor, K.; Moise, T.; McAdams, H.; McPherson, J.; Bailey, R.; Fox, G.; Depner, M.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 4(3):436-449 Sep, 2004
Conference
1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers VLSI Technology, Systems, and Applications, 1991. Proceedings of Technical Papers, 1991 International Symposium on. :90-93 1991
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