학술논문
'학술논문'
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Conference
Barve, S.; Haehn, N.; Socolik, C.; Ruen, Aaron; Mayersky, Joshua; Reed, Amber; Leedy, Kevin; Jha, R.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
2022 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2022 IEEE. :1-7 Oct, 2022
Conference
NAECON 2021 - IEEE National Aerospace and Electronics Conference Aerospace and Electronics Conference, NAECON 2021 - IEEE National. :239-242 Aug, 2021
Academic Journal
Academic Journal
MRS Communications; Jun2021, Vol. 11 Issue 3, p288-294, 7p
Academic Journal
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제한된 항목
[AR] Mayersky, Joshua
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