학술논문
'학술논문'
에서 검색결과 29건 | 목록
1~10
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, November 2023, 150)
Academic Journal
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 10:490-494 2022
Conference
2019 19th Non-Volatile Memory Technology Symposium (NVMTS) Non-Volatile Memory Technology Symposium (NVMTS), 2019 19th. :1-5 Oct, 2019
Academic Journal
Gay, R.; Marca, V.D.; Aziza, H.; Mantelli, M.; Trenteseaux, F.; Rosa, F.L.; Regnier, A.; Niel, S.; Marzaki, A.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 42(6):832-834 Jun, 2021
Academic Journal
IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 19:214-222 2020
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(10):4282-4289 Oct, 2018
Academic Journal
Yazigy, N.; Postel-Pellerin, J.; Marca, V.D.; Terziyan, K.; Nadifi, S.; Canet, P.; Sousa, R.C.; Di Pendina, G.
In: Microelectronics Reliability . (Microelectronics Reliability, November 2022, 138)
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, November 2022, 138)
Conference
In: IEEE International Conference on Microelectronic Test Structures , 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings. (IEEE International Conference on Microelectronic Test Structures, 2024)
Academic Journal
Melul, F.; Marca, V.D.; Bocquet, M.; Laine, P.; Akbal, M.; Mantelli, M.; Hesse, M.; Regnier, A.; La Rosa, F.; Trenteseaux, F.; Niel, S.
In: Microelectronics Reliability . (Microelectronics Reliability, November 2021, 126)
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제한된 항목
[AR] Marca, V.D.
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