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Academic Journal
Mal-Sarkar, Tatini; Keyes, Katherine; Koen, Nastassja; Barnett, Whitney; Myer, Landon; Rutherford, Caroline; Zar, Heather J.; Stein, Dan J.; Lund, Crick
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Conference
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on. :55-58 Oct, 2012
Conference
2011 IEEE 29th International Conference on Computer Design (ICCD) Computer Design (ICCD), 2011 IEEE 29th International Conference on. :297-300 Oct, 2011
Academic Journal
Keyes, Katherine M.; Jager, Justin; Mal‐Sarkar, Tatini; Patrick, Megan E.; Rutherford, Caroline; Hasin, Deborah
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