학술논문
'학술논문'
에서 검색결과 47건 | 목록
1~10
Conference
1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395) Plasma process-induced damage Plasma Process-Induced Damage, 1999 4th International Symposium on. :88-91 1999
Conference
Lin, T.; Chen, C.; Hsu, S.Y.; Tsai, M.J.; Yew, T.R.; Chou, J.W.; Huang, K.T.; Wu, J.Y.; Ku, Y.C.; Liu, C.C.; Yang, M.S.; Yeh, W.K.; Huang, C.H.; Lur, W.; Huang, H.S.; Sun, S.W.
1998 Semiconductor Manufacturing Technology Workshop (Cat. No.98EX133) Semiconductor manufacturing technology Semiconductor Manufacturing Technology Workshop, 1998. :57-60 1998
Conference
Lin, T.; Chen, C.; Hsu, S.Y.; Tsai, M.J.; Yew, T.R.; Chou, J.W.; Haung, K.T.; Wu, J.Y.; Ku, Y.C.; Liu, C.C.; Yang, M.S.; Yeh, W.K.; Huang, C.H.; Lur, W.; Huang, H.S.; Sun, S.W.
International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :851-854 1997
Conference
International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :837-840 1996
Conference
Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat. No.99EX247) Interconnect technology Interconnect Technology, 1999. IEEE International Conference. :65-67 1999
Academic Journal
Academic Journal
Conference
In: International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings . (International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings, 1999, :88-91)
Conference
In: Materials Research Society Symposium - Proceedings . (Materials Research Society Symposium - Proceedings, 1999, 564:177-182)
Academic Journal
Chang, T.C.; Mor, Y.S.; Tsai, T.M.; Chen, C.W.; Szeb, S.M.; Liu, P.T.; Pan, F.M.; Chu, C.J.; Lur, W.
In: Journal of the Electrochemical Society . (Journal of the Electrochemical Society, October 2002, 149(10):F145-F148)
검색 결과 제한하기
제한된 항목
[AR] Lur, W.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어