학술논문
'학술논문'
에서 검색결과 38건 | 목록
1~10
Conference
Kang, Sung-Taeg; Winstead, B.; Yater, J.; Suhail, M.; Zhang, G.; Hong, C.-M.; Gasquet, H.; Kolar, D.; Shen, J.; Min, B.; Loiko, K.; Hardell, A.; LePore, E.; Parks, R.; Syzdek, R.; Williams, S.; Malloch, W.; Chindalore, G.; Chen, Y.; Shao, Y.; Huajun, L.; Louis, L.; Chaw, S.
2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-4 May, 2012
Conference
Yater, Jane; Hong, C.; Kang, S.-T.; Kolar, D.; Min, B.; Shen, J.; Chindalore, G.; Loiko, K.; Winstead, B.; Williams, S.; Gasquet, H.; Suhail, M.; Broeker, K.; Lepore, E.; Hardell, A.; Malloch, W.; Syzdek, R.; Chen, Y.; Ju, Y.; Kumarasamy, S.; Liu, H.; Lei, L.; Indajang, B.
2011 3rd IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2011 3rd IEEE International. :1-4 May, 2011
Conference
Yater, Jane; Kang, S.-T.; Hong, C. M.; Min, B.; Kolar, D.; Loiko, K.; Shen, J.; Winstead, B.; Gasquet, H.; Mohammed, S.; Hardell, A.; Malloch, W.; Cook, B.; Syzdek, R.; Jarrar, A.; Feddeler, J.; Baker, K.; Chang, K.M.; Herrin, S.; Parks, R.; Chindalore, G.
2012 IEEE International Conference on IC Design & Technology IC Design & Technology (ICICDT), 2012 IEEE International Conference on. :1-3 May, 2012
Conference
2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :2E-2.1-2E-2.5 Apr, 2017
Conference
Yater, Jane; Suhail, M.; Kang, S.-T.; Shen, J.; Hong, C.; Merchant, T.; Rao, R.; Gasquet, H.; Loiko, K.; Winstead, B.; Williams, S.; Rossow, M.; Malloch, W.; Syzdek, R.; Chindalore, G.
2009 IEEE International Memory Workshop Memory Workshop, 2009. IMW '09. IEEE International. :1-2 May, 2009
Conference
Grudowski, P.; Dhandapani, V.; Zollner, S.; Goedeke, D.; Loiko, K.; Tekleab, D.; Adams, V.; Spencer, G.; Desjardins, H.; Prabhu, L.; Garcia, R.; Foisy, M.; Theodore, D.; Bauer, M.; Weeks, D.; Thomas, S.; Thean, A.; White, B.
2007 IEEE International SOI Conference SOI Conference, 2007 IEEE International. :17-18 Oct, 2007
Conference
Taylor, W.J.; Capasso, C.; Min, B.; Winstead, B.; Verret, E.; Loiko, K.; Gilmer, D.; Hegde, R.I.; Schaeffer, J.; Luckowski, E.; Martinez, A.; Raymond, M.; Happ, C.; Triyoso, D.H.; Kalpat, S.; Haggag, A.; Roan, D.; Nguyen, J.-Y.; La, L.B.; Hebert, L.; Smith, J.; Jovanovic, D.; Burnett, D.; Foisy, M.; Cave, N.; Tobin, P.J.; Samavedam, S.B.; White, B.E.; Venkatesan, S.
2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006
Conference
Xiang-Zheng Bo; Grudowski, P.; Adams, V.; Loiko, K.; Tekleab, D.; Filipiak, S.; Hackenberg, J.; Kolagunta, V.; Foisy, M.; Li-Te Lin; Fung, K.H.; Chi-Hsi Wu; Hsiao-Chin Tuan; Cheek, J.
2006 IEEE international SOI Conferencee Proceedings International SOI Conference, 2006 IEEE. :19-20 Oct, 2006
Conference
2006 International Conference on Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices, 2006 International Conference on. :119-122 Sep, 2006
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제한된 항목
[AR] Loiko, K.
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