학술논문
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Academic Journal
Nirschl, Th.; Ostermayr, M.; Olbrich, A.; Vietzke, D.; Omer, M.; Linnenbank, C.; Schaper, U.; Pottgiesser, Y.; Pottgiesser, J.; Johansson, M.; Simon, U.; Joens, A.
In Microelectronics Reliability 2003 43(9):1383-1387
Conference
Nirschl, T.; Henzler, St.; Fischer, J.; Bargagli-Stoffi, A.; Fulde, M.; Sterkel, M.; Teichmann, P.; Schaper, U.; Einfeld, J.; Linnenbank, C.; Sedlmeir, J.; Weber, C.; Heinrich, R.; Ostermayr, N.; Olbrich, A.; Dobler, B.; Ruderer, E.; Kakoschke, R.; Schrufert, K.; Georgakos, G.; Hansch, W.; Schmitt-Landsiedel, D.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :173-176 2005
Conference
Schaper, U.; Linnenbank, C.; Kollmer, U.; Mulatz, H.; Mensing, T.; Schmidt, R.; Tilgner, R.; Thewes, A.R.
ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :1-5 2001
Conference
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) Microelectronic test structures Microelectronic Test Structures, 2000. ICMTS 2000. Proceedings of the 2000 International Conference on. :148-152 2000
Conference
Thewes, R.; Linnenbank, C.; Kollmer, U.; Burges, S.; DiLeo, M.; Clincy, M.; Schaper, U.; Brederlow, R.; Seibert, R.; Weber, W.
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) Microelectronic test structures Microelectronic Test Structures, 2000. ICMTS 2000. Proceedings of the 2000 International Conference on. :137-141 2000
Conference
ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705) Solid-state circuits Solid-State Circuits Conference, 2003. ESSCIRC '03. Proceedings of the 29th European. :703-705 2003
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 21(12):552-553 Dec, 2000
Conference
Nirschl, T.; Henzler, St.; Fischer, J.; Bargagli-Stoffi, A.; Fulde, M.; Sterkel, M.; Teichmann, P.; Schaper, U.; Einfeld, J.; Linnenbank, C.; Sedlmeir, J.; Weber, C.; Heinrich, R.; Ostermayr, N.; Olbrich, A.; Dobler, B.; Ruderer, E.; Kakoschke, R.; Schrufert, K.; Georgakos, G.
Proceedings of 35th European Solid-State Device Research Conference, 2005 (ESSDERC 2005); 2005, p173-176, 4p
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제한된 항목
[AR] Linnenbank, C.
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