학술논문
'학술논문'
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1~10
Academic Journal
Underwood, D.; Glick, J.A.; Inoue, K.; Frank, D.J.; Timmerwilke, J.; Pritchett, E.; Chakraborty, S.; Tien, K.; Yeck, M.; Bulzacchelli, J.F.; Baks, C.; Robertazzi, R.; Beck, M.; Joshi, R.V.; Wisnieff, D.; Lekuch, S.; Gaucher, B.P.; Friedman, D.J.; Rosno, P.; Ramirez, D.; Ruedinger, J.
In: PRX Quantum . (PRX Quantum, January 2024, 5(1))
Academic Journal
Chakraborty, S.; Frank, D.J.; Tien, K.; Rosno, P.; Yeck, M.; Glick, J.A.; Robertazzi, R.; Richetta, R.; Bulzacchelli, J.F.; Underwood, D.; Ramirez, D.; Yilma, D.; Davies, A.; Joshi, R.V.; Chambers, S.D.; Lekuch, S.; Inoue, K.; Wisnieff, D.; Baks, C.W.; Bethune, D.S.; Timmerwilke, J.; Fox, T.; Song, P.; Johnson, B.R.; Gaucher, B.P.; Friedman, D.J.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 57(11):3258-3273 Nov, 2022
Academic Journal
DeBole, M.; Taba, B.; Amir, A.; Akopyan, F.; Andreopoulos, A.; Risk, W.; Kusnitz, J.; Ortega Otero, C.; Nayak, T.; Appuswamy, R.; Carlson, P.; Cassidy, A.; Datta, P.; Esser, S.; Garreau, G.; Holland, K.; Lekuch, S.; Mastro, M.; McKinstry, J.; di Nolfo, C.; Paulovicks, B.; Sawada, J.; Schleupen, K.; Shaw, B.; Klamo, J.; Flickner, M.; Arthur, J.; Modha, D.
Computer. 52(5):20-29 May, 2019
Conference
Sawada, J.; Akopyan, F.; Cassidy, A.S.; Taba, B.; Debole, M.V.; Datta, P.; Alvarez-Icaza, R.; Amir, A.; Arthur, J.V.; Andreopoulos, A.; Appuswamy, R.; Baier, H.; Barch, D.; Berg, D.J.; Di Nolfo, C.; Esser, S.K.; Flickner, M.; Horvath, T.A.; Jackson, B.L.; Kusnitz, J.; Lekuch, S.; Mastro, M.; Melano, T.; Merolla, P.A.; Millman, S.E.; Nayak, T.K.; Pass, N.; Penner, H.E.; Risk, W.P.; Schleupen, K.; Shaw, B.; Wu, H.; Giera, B.; Moody, A.T.; Mundhenk, N.; Van Essen, B.C.; Wang, E.X.; Widemann, D.P.; Wu, Q.; Murphy, W.E.; Infantolino, J.K.; Ross, J.A.; Shires, D.R.; Vindiola, M.M.; Namburu, R.; Modha, D.S.
SC16: International Conference for High Performance Computing, Networking, Storage and Analysis SC High Performance Computing, Networking, Storage and Analysis, SC16: International Conference for. :130-141 Nov, 2016
Academic Journal
In: Physical Review Letters . (Physical Review Letters, 3 September 2021, 127(10))
Conference
Aylward, J.; Crawford, C.H.; Inoue, K.; Lekuch, S.; Muller, K.; Nutter, M.; Penner, H.; Schleupen, K.; Xenidis, J.
2011 International Conference on Reconfigurable Computing and FPGAs Reconfigurable Computing and FPGAs (ReConFig), 2011 International Conference on. :351-356 Nov, 2011
Conference
Callanan, O.; Castelfranco, A.; Crawford, C. H.; Creedon, E.; Lekuch, S.; Muller, K.; Nutter, M.; Penner, H.; Purcell, B.; Purcell, M.; Xenidis, J.
2011 22nd IEEE International Symposium on Rapid System Prototyping Rapid System Prototyping (RSP), 2011 22nd IEEE International Symposium on. :45-52 May, 2011
Conference
2007 International Conference on Field Programmable Logic and Applications Field Programmable Logic and Applications, 2007. FPL 2007. International Conference on. :533-536 Aug, 2007
Conference
Frank, D.J.; Chakraborty, S.; Tien, K.; Yeck, M.; Glick, J.A.; Robertazzi, R.; Bulzacchelli, J.F.; Joshi, R.V.; Lekuch, S.; Inoue, K.; Underwood, D.; Wisnieff, D.; Baks, C.; Timmerwilke, J.; Song, P.; Johnson, B.R.; Gaucher, B.P.; Friedman, D.J.; Rosno, P.; Richetta, R.; Ramirez, D.; Yilma, D.; Davies, A.
In: Proceedings of the Custom Integrated Circuits Conference , 2023 IEEE Custom Integrated Circuits Conference, CICC 2023 - Proceedings. (Proceedings of the Custom Integrated Circuits Conference, 2023, 2023-April)
Conference
Tien, K.; Inoue, K.; Lekuch, S.; Frank, D.J.; Chakraborty, S.; Fox, T.; Yeck, M.; Glick, J.A.; Robertazzi, R.; Richetta, R.; Bulzacchelli, J.F.; Davies, A.; Joshi, R.V.; Underwood, D.; Wisnieff, D.; Baks, C.; Timmerwilke, J.; Johnson, B.R.; Gaucher, B.P.; Friedman, D.J.; Rosno, P.; Ramirez, D.; Yilma, D.; Bethune, D.
In: Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 , Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022. (Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022, 2022, :13-16)
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[AR] Lekuch, S.
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