학술논문
'학술논문'
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Conference
Medina, L.; Carrion, S.; Andreu, P.; Picornell, T.; Flich, J.; Hernandez, C.; Sandoval, M.; Sainz, M.; Lefebvre, C.-A.; Ronnback, M.; Matschnig, M.; Wess, M.; Taucher, H.
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :636-639 Mar, 2022
Conference
Hernandez, C.; Flieh, J.; Paredes, R.; Lefebvre, C.-A.; Allende, I.; Abella, J.; Trilla, D.; Matschnig, M.; Fischer, B.; Schwarz, K.; Kiszka, J.; Ronnback, M.; Klockars, J.; McGuire, N.; Rammerstorfer, F.; Schwarzl, C.; Wartet, F.; Ludemann, D.; Labayen, M.
2020 23rd Euromicro Conference on Digital System Design (DSD) Digital System Design (DSD), 2020 23rd Euromicro Conference on. :370-377 Aug, 2020
Academic Journal
Labbé, M.-O.; Lefebvre, C.-A.; Dostie, S.; Prévost, M.; Guindon, Y.; Collins, L.; Maharsy, W.; Beauregard, J.; Nemer, M.
In: Bioorganic and Medicinal Chemistry Letters . (Bioorganic and Medicinal Chemistry Letters, 15 March 2020, 30(6))
Academic Journal
Forcellini, E.; Boutin, S.; Lefebvre, C.-A.; Paquin, J.-F.; Shayhidin, E.E.; Boulanger, M.-C.; Rhéaume, G.; Mathieu, P.; Barbeau, X.; Lagüe, P.
In: European Journal of Medicinal Chemistry . (European Journal of Medicinal Chemistry, 10 March 2018, 147:130-149)
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, December 2017, 79:433-439)
Academic Journal
Lefebvre, C.-A.; Forcellini, E.; Boutin, S.; Paquin, J.-F.; Côté, M.-F.; C.-Gaudreault, R.; Mathieu, P.; Lagüe, P.
In: Bioorganic and Medicinal Chemistry Letters . (Bioorganic and Medicinal Chemistry Letters, 2017, 27(2):299-302)
Academic Journal
In: European Journal of Medicinal Chemistry . (European Journal of Medicinal Chemistry, 11 June 2015, 100:34-43)
Conference
In: THERMINIC 2016 - 22nd International Workshop on Thermal Investigations of ICs and Systems , THERMINIC 2016 - 22nd International Workshop on Thermal Investigations of ICs and Systems. (THERMINIC 2016 - 22nd International Workshop on Thermal Investigations of ICs and Systems, 18 November 2016, :276-278)
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[AR] Lefebvre, C.-A.
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