학술논문
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The Influence of the Block Design on the ID-VD Curves of Power Transistor for E-SOA Characterization
Conference
Chen, Chun-Chih; Chien, Shih-Chieh; Wang, Chien-Wei; Chiu, Yu-Sheng; Chuang, Jung-Tsun; Chen, Li-Fan; Chuang, Chieh-Yao; Lee, Jian-Hsing
2024 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) Consumer Electronics - Taiwan (ICCE-Taiwan), 2024 International Conference on. :779-780 Jul, 2024
Conference
2024 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) Consumer Electronics - Taiwan (ICCE-Taiwan), 2024 International Conference on. :781-782 Jul, 2024
Conference
Lee, Jian-Hsing; Li, Ching-Ho; Nidhi, Karuna; Lin, Chih-Hsuan; Chuang, Chieh-Yao; Lin, Wei-Hsin; Hsu, Kei-Chieh; Jou, Yeh-Ning; Huang, Shao-Chang; Liao, Chih-Cherng; Chen, Ke-Horng
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-7 Jul, 2023
Conference
Lee, Jian-Hsing; Li, Ching-Ho; Liao, Chih-Cherng; Huang, Yeh-Jen; Nidhi, Karuna; Hong, Li-Yang; Lin, Ting-You; Jou, Yeh-Ning; Huang, Shao-Chang; Chen, Ke-Horng
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-7 Jul, 2023
Academic Journal
Huang, Shao-Chang; Li, Ching-Ho; Liao, Chih-Cherng; Chen, Li-Fan; Chen, Chun-Chih; Hsu, Kai-Chieh; Lin, Gong-Kai; Lin, Chih-Hsuan; Lee, Jian-Hsing; Kao, Yu-Yung; Chen, Ke-Horng
In Microelectronics Reliability October 2021 125
Conference
Lee, Jian-Hsing; Lin, Gong-Kai; Chen, Chun-Chih; Chen, Li-Fan; Wang, Chien-Wei; Huang, Shao-Chang; Li, Ching-Ho; Liao, Chih-Cherng; Chuang, Jung-Tsun; Chen, Ke-Horng
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023
Conference
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2022 IEEE International Symposium on the. :1-6 Jul, 2022
Conference
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2022 IEEE International Symposium on the. :1-5 Jul, 2022
Conference
Huang, Shao-Chang; Li, Ching-Ho; Liao, Chih-Cherng; Chuang, Jung-Tsun; Wang, Chien-Wei; Lin, Gong-Kai; Chen, Lin-Fan; Chen, Chun-Chih; Ho, Kuan-I; Chang, Che-Hua; Yang, Hsiao-Ying; Lao, Chung-Ren; Lee, Jian-Hsing; Chen, Ke-Horng
2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) Consumer Electronics - Taiwan (ICCE-Taiwan), 2023 International Conference on. :219-220 Jul, 2023
Conference
Huang, Shao-Chang; Hsu, Kai-Chieh; Lin, Chih-Hsuan; Wang, Chien-Wei; Li, Ching-Ho; Liao, Chih-Cherng; Chuang, Jung-Tsun; Lin, Gong-Kai; Chen, Lin-Fan; Chen, Chun-Chih; Jou, Yeh-Ning; Lee, Jian-Hsing; Chen, Ke-Horng
2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) Consumer Electronics - Taiwan (ICCE-Taiwan), 2023 International Conference on. :221-222 Jul, 2023
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[AR] Lee, Jian-Hsing
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