학술논문
'학술논문'
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1~10
Conference
2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024
Conference
Jouppi, Norman P.; Young, Cliff; Patil, Nishant; Patterson, David; Agrawal, Gaurav; Bajwa, Raminder; Bates, Sarah; Bhatia, Suresh; Boden, Nan; Borchers, Al; Boyle, Rick; Cantin, Pierre-luc; Chao, Clifford; Clark, Chris; Coriell, Jeremy; Daley, Mike; Dau, Matt; Dean, Jeffrey; Gelb, Ben; Ghaemmaghami, Tara Vazir; Gottipati, Rajendra; Gulland, William; Hagmann, Robert; Ho, C. Richard; Hogberg, Doug; Hu, John; Hundt, Robert; Hurt, Dan; Ibarz, Julian; Jaffey, Aaron; Jaworski, Alek; Kaplan, Alexander; Khaitan, Harshit; Killebrew, Daniel; Koch, Andy; Kumar, Naveen; Lacy, Steve; Laudon, James; Law, James; Le, Diemthu; Leary, Chris; Liu, Zhuyuan; Lucke, Kyle; Lundin, Alan; MacKean, Gordon; Maggiore, Adriana; Mahony, Maire; Miller, Kieran; Nagarajan, Rahul; Narayanaswami, Ravi; Ni, Ray; Nix, Kathy; Norrie, Thomas; Omernick, Mark; Penukonda, Narayana; Phelps, Andy; Ross, Jonathan; Ross, Matt; Salek, Amir; Samadiani, Emad; Severn, Chris; Sizikov, Gregory; Snelham, Matthew; Souter, Jed; Steinberg, Dan; Swing, Andy; Tan, Mercedes; Thorson, Gregory; Tian, Bo; Toma, Horia; Tuttle, Erick; Vasudevan, Vijay; Walter, Richard; Wang, Walter; Wilcox, Eric; Yoon, Doe Hyun
2017 ACM/IEEE 44th Annual International Symposium on Computer Architecture (ISCA) Computer Architecture (ISCA), 2017 ACM/IEEE 44th Annual International Symposium on. :1-12 Jun, 2017
Conference
Wu, Jingyue; Belevich, Artem; Bendersky, Eli; Heffernan, Mark; Leary, Chris; Pienaar, Jacques; Roune, Bjarke; Springer, Rob; Weng, Xuetian; Hundt, Robert
2016 IEEE/ACM International Symposium on Code Generation and Optimization (CGO) Code Generation and Optimization (CGO), 2016 IEEE/ACM International Symposium on. :105-116 Mar, 2016
Conference
Karandikar, Sagar; Leary, Chris; Kennelly, Chris; Zhao, Jerry; Parimi, Dinesh; Nikolic, Borivoje; Asanovic, Krste; Ranganathan, Parthasarathy
MICRO-54: 54th Annual IEEE/ACM International Symposium on Microarchitecture. :462-478
Periodical
Environmental Design & Construction. Oct, 2007, Vol. 10 Issue 10, p112, 4 p.
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[AR] Leary, Chris
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