학술논문
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Academic Journal
In Studies in Surface Science and Catalysis 2007 170:199-205
Conference
Conference Record of the 2000 IEEE Industry Applications Conference. Thirty-Fifth IAS Annual Meeting and World Conference on Industrial Applications of Electrical Energy (Cat. No.00CH37129) Industry applications conference Industry Applications Conference, 2000. Conference Record of the 2000 IEEE. 4:2604-2612 vol.4 2000
Conference
Conference Record of the 2000 IEEE Industry Applications Conference. Thirty-Fifth IAS Annual Meeting and World Conference on Industrial Applications of Electrical Energy (Cat. No.00CH37129) Industry applications conference Industry Applications Conference, 2000. Conference Record of the 2000 IEEE. 4:2626-2628 vol.4 2000
Academic Journal
IEEE Transactions on Industry Applications IEEE Trans. on Ind. Applicat. Industry Applications, IEEE Transactions on. 37(4):1088-1097 Aug, 2001
Academic Journal
be Isa, J.; Segerer, B.; Miller, A.; Kaffenberger, C.; Dräger, T.; Korn, C.; Franz, M.; Boppert, J.; Latzel, S.
In: ZWF Zeitschrift fuer Wirtschaftlichen Fabrikbetrieb . (ZWF Zeitschrift fuer Wirtschaftlichen Fabrikbetrieb, 2019, 114(11):711-714)
Conference
In: AISTech - Iron and Steel Technology Conference Proceedings , AISTech 2022 - Proceedings of the Iron and Steel Technology Conference. (AISTech - Iron and Steel Technology Conference Proceedings, 2022, 2022-May:752-757)
Academic Journal
In: Biological Invasions . (Biological Invasions, 1 November 2016, 18(11):3163-3173)
Academic Journal
Niewöhner, L.; Barth, M.; Neimke, D.; Latzel, S.; Stamouli, A.; Nys, B.; Gunaratnam, L.; Fries, K.; Uhlig, S.; Baldauf, H.
In: Forensic Chemistry . (Forensic Chemistry, 1 August 2016, 1:22-30)
Academic Journal
Nicholl, J.; Waters, W.; Mulley, J.C.; Suwalski, S.; Brown, S.; Hull, Y.; Bain, S.M.; Yu, S.; Friend, K.; Barnett, C.; Haan, E.; Thompson, E.M.; Liebelt, J.; Mcgregor, L.; Harbord, M.G.; Entwistle, J.; Munt, C.; White, D.; Chitti, A.; Baulderstone, D.; Ketteridge, D.; Consortium, A.R.; Abbott, K.; Bata, S.; Benard, Y.; Bethell, J.; Bratkovic, D.; Chan, Y.; Chong, V.; Cockington, R.; Concepcion, M.; Conway, B.; Corlis, D.; Crafter, S.; Cossick, M.; Coventry, L.; Eckersley, L.; Egan, P.; Forster, G.; Gallus, L.; Gehlot, S.; Gilby, D.; Goodall, C.; Grieve, A.; Haque, S.; Han, T.; Ibrahim, A.; Ingole, A.; Jaensch, J.; Jeyaseelan, D.; Katdare, A.; Klaric, S.; Kritzinger, D.; Lamb, C.; Lang, P.; Latzel, S.; Lawrence, D.; Lee, C.; Lee, K.; MacDonald, K.; Machet, P.; Mathew, S.; Nair, P.; Noori, K.; Nozza, J.; Nugent, M.; Ogle, N.; O'Keefe, M.; Pallas, G.; Parry, P.; Pearson, C.; Petek, P.; Pouras, T.; Power, R.; Pridmore, C.; Quinn, P.; Rasiah, K.; Ricci, N.; Rice, J.; Smiley, M.; Smith, J.; Staridas, W.; Stewart, N.; Tabart, W.; Thesinger, M.; Thomas, D.; Thomas, R.; Thompson, S.; Tidemann, A.; Tsourtos, C.; Vasilunas, S.; Whyatt, C.; Yiu, M.
In: Pathology . (Pathology, January 2014, 46(1):41-45)
Academic Journal
In: Forensic Science International . (Forensic Science International, 30 November 2012, 223(1-3):273-278)
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[AR] Latzel, S.
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