학술논문
'학술논문'
에서 검색결과 31건 | 목록
1~10
Academic Journal
Marinins, A.; Hansch, S.; Sar, H.; Chancerel, F.; Golshani, N.; Wang, H.; Tsiara, A.; Coenen, D.; Verheyen, P.; Capuz, G.; De Koninck, Y.; Yilmaz, O.; Morthier, G.; Schleicher, F.; Jamieson, G.; Smyth, S.; McKee, A.; Ban, Y.; Pantouvaki, M.; La Tulipe, D.C.; Van Campenhout, J.
IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 29(3: Photon. Elec. Co-Inte. and Adv. Trans. Print.):1-11 Jun, 2023
Conference
Topol, A.W.; La Tulipe, D.C.; Shi, L.; Alam, S.M.; Frank, D.J.; Steen, S.E.; Vichiconti, J.; Posillico, D.; Cobb, M.; Medd, S.; Patel, J.; Goma, S.; DiMilia, D.; Robson, M.T.; Duch, E.; Farinelli, M.; Wang, C.; Conti, R.A.; Canaperi, D.M.; Deligianni, L.; Kumar, A.; Kwietniak, K.T.; D'Emic, C.; Ott, J.; Young, A.M.; Guarini, K.W.; Ieong, M.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :352-355 2005
Conference
Sixth International Conference Metalorganic Vapor Phase Epitaxy Metalorganic Vapor Phase Epitaxy, 1992. Sixth International Conference. :167-168 1992
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Conference
Derakhshandeh, J.; Beyne, E.; Beyer, G.; Capuz, G.; Cherman, V.; De Preter, I.; Gerets, C.; Shafahian, E.; Kennes, K.; Jamieson, G.; Cochet, T.; Webers, T.; Tobback, B.; Van Der Plas, G.; La Tulipe, D.C.; Phommahaxay, A.; Miller, A.
In: Proceedings - Electronic Components and Technology Conference , Proceedings - IEEE 72nd Electronic Components and Technology Conference, ECTC 2022. (Proceedings - Electronic Components and Technology Conference, 2022, 2022-May:1108-1113)
Conference
Derakhshandeh, J.; La Tulipe, D.C.; Capuz, G.; Cherman, V.; Gerets, C.; Cochet, T.; Shafahian, E.; Preter, I.D.; Jamieson, G.; Webers, T.; Beyne, E.; Beyer, G.; Miller, A.
In: 2022 International Conference on Electronics Packaging, ICEP 2022 , 2022 International Conference on Electronics Packaging, ICEP 2022. (2022 International Conference on Electronics Packaging, ICEP 2022, 2022, :131-132)
Conference
IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. Proceedings. High Speed Semiconductor Devices and Circuits, 1987. Proceedings., IEEE/Cornell Conference on Advanced Concepts in. :121-134 1987
Conference
Baratte, H.; La Tulipe, D.C.; Knoedler, C.M.; Jackson, T.N.; Frank, D.J.; Solomon, P.M.; Wright, S.L.
1986 International Electron Devices Meeting IEDM Tech. Dig. Electron Devices Meeting, 1986 International. :444-447 1986
Conference
Derakhshandeh, J.; Gerets, C.; Inoue, F.; Capuz, G.; Cherman, V.; Lofrano, M.; Hou, L.; Cochet, T.; de Preter, I.; Webers, T.; Bex, P.; Jamieson, G.; Maehara, M.; Shafahian, E.; Bertheau, J.; Beyne, E.; la Tulipe, D.C.; Beyer, G.; van der Plas, G.; Miller, A.
In: Proceedings - Electronic Components and Technology Conference , Proceedings - IEEE 71st Electronic Components and Technology Conference, ECTC 2021. (Proceedings - Electronic Components and Technology Conference, 2021, 2021-June:1119-1124)
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 8(10):486-488 Oct, 1987
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[AR] La Tulipe, D.C.
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