학술논문
'학술논문'
에서 검색결과 24건 | 목록
1~10
Academic Journal
Calvin Yi-Ping Chao; Meng-Hsu Wu; Shang-Fu Yeh; Chin-Hao Chang; Chi-Lin Lee; Chin Yin; Kuo-Yu Chou; Honyih Tu
IEEE Journal of the Electron Devices Society, Vol 9, Pp 972-984 (2021)
Academic Journal
Calvin Yi-Ping Chao; Thomas M.-H. Wu; Shang-Fu Yeh; Kuo-Yu Chou; Honyih Tu; Chih-Lin Lee; Chin Yin; Philippe Paillet; Vincent Goiffon
IEEE Journal of the Electron Devices Society, Vol 7, Pp 227-238 (2019)
Academic Journal
IEEE Journal of the Electron Devices Society, Vol 5, Iss 1, Pp 79-89 (2017)
Academic Journal
IEEE Journal of the Electron Devices Society, Vol 2, Iss 4, Pp 59-64 (2014)
Academic Journal
Biay-Cheng Hseih; Calvin Chao; Chin-Hao Chang; Hasib Siddiqui; Keith Honea; Khoi Le; Kuo-Yu Chou; RJ Lin; Sami Khawam; Sergio Goma
ITE Technical Report. 2016, :5
Academic Journal
Seiji Takahashi; Yi-Min Huang; Jhy-Jyi Sze; Tung-Ting Wu; Fu-Sheng Guo; Wei-Cheng Hsu; Tung-Hsiung Tseng; King Liao; Chin-Chia Kuo; Tzu-Hsiang Chen; Wei-Chieh Chiang; Chun-Hao Chuang; Keng-Yu Chou; Chi-Hsien Chung; Kuo-Yu Chou; Chien-Hsien Tseng; Chuan-Joung Wang; Dun-Nien Yaung
Sensors, Vol 17, Iss 12, p 2816 (2017)
Academic Journal
Calvin Yi-Ping Chao; Honyih Tu; Thomas Meng-Hsiu Wu; Kuo-Yu Chou; Shang-Fu Yeh; Chin Yin; Chih-Lin Lee
Sensors, Vol 17, Iss 12, p 2704 (2017)
Conference
ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :239-244 2001
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 49(12):2279-2287 Dec, 2002
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 2(3):50-59 Sep, 2002
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[AR] Kuo-Yu Chou
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