학술논문

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발행년	- (예 : 2010-2015)

Reliability Improvement of Amorphous InGaZnO Thin-Film Transistors by Less Hydroxyl-Groups Siloxane Passivation

Academic Journal

Kulchaisit, C.; Ishikawa, Y.; Fujii, M. N.; Yamazaki, H.; Soria Bermundo, J. P.; Ishikawa, S.; Miyasako, T.; Katsui, H.; Tanaka, K.; Hamada, K.; Horita, M.; Uraoka, Y.

Journal of Display Technology J. Display Technol. Display Technology, Journal of. 12(3):263-267 Mar, 2016

Full Text (OSA) Full Text (IEEE) Scopus Find it@PNU

High-Performance Fully Solution-Processed Oxide Thin-Film Transistors via Photo-Assisted Role Tuning of InZnO

Academic Journal

Corsino, D.C.; Bermundo, J.P.S.; Kulchaisit, C.; Fujii, M.N.; Ishikawa, Y.; Uraoka, Y.; Ikenoue, H.

In: ACS Applied Electronic Materials. (ACS Applied Electronic Materials, 25 August 2020, 2(8):2398-2407)

Full Text (ACS) Web of Science JCR 저널정보 Scopus Find it@PNU

Rapid photo-assisted activation and enhancement of solution-processed InZnO thin-film transistors

Academic Journal

Bermundo, J.P.S.; Kulchaisit, C.; Ishikawa, Y.; Fujii, M.N.; Uraoka, Y.; Ikenoue, H.

In: Journal of Physics D: Applied Physics. (Journal of Physics D: Applied Physics, 2020, 53(4))

Full Text (IOP Science) Full Text (IOP) Web of Science JCR 저널정보 Scopus Find it@PNU

High performance top gate a-IGZO TFT utilizing siloxane hybrid material as a gate insulator

Academic Journal

Kulchaisit, C.; Bermundo, J.P.S.; Fujii, M.N.; Ishikawa, Y.; Uraoka, Y.

In: AIP Advances. (AIP Advances, 1 September 2018, 8(9))

Full Text (AIP) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

High performance all solution processed oxide thin-film transistor via photo-induced semiconductor-to-conductor transformation of a-InZnO

Conference

Bermundo, J.P.S.; Kulchaisit, C.; Corsino, D.C.; Syairah, A.; Fujii, M.N.; Ishikawa, Y.; Uraoka, Y.; Ikenoue, H.

In: Digest of Technical Papers - SID International Symposium. (Digest of Technical Papers - SID International Symposium, 2019, 50(Book 1):422-425)

Full Text (FRIC Online Journal) Full Text (Wiley Journals) Full Text (Wiley-DB) Scopus Find it@PNU

Analysis of high mobility oxide thin-film transistors after a low temperature annealing process

Conference

Bermundo, J.P.; Ishikawa, Y.; Fujii, M.N.; Kulchaisit, C.; Uraoka, Y.; Ikenoue, H.

In: 23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016, 23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016. (23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016, 2016, 2:839-840)

Scopus Find it@PNU

Reliability improvement of amorphous InGaZnO thin-film transistors by less hydroxyl-groups siloxane passivation

Conference

Kulchaisit, C.; Ishikawa, Y.; Fujii, M.N.; Yamazaki, H.; Bermundo, J.P.; Uraoka, Y.; Ishikawa, S.; Miyasako, T.; Katsui, H.; Tanaka, K.; Hamada, K.-I.

In: Proceedings of the International Display Workshops, 22nd International Display Workshops, IDW 2015. (Proceedings of the International Display Workshops, 2015, 2:658-659)

Scopus Find it@PNU

Reliability of bottom gate amorphous InGaZnO thin-film transistors with siloxane passivation layer

Conference

Kulchaisit, C.; Fujii, M.; Ueoka, Y.; Bermundo, J.P.; Horita, M.; Ishikawa, Y.; Uraoka, Y.

In: IMFEDK 2014 - 2014 International Meeting for Future of Electron Devices, Kansai. (IMFEDK 2014 - 2014 International Meeting for Future of Electron Devices, Kansai, 28 July 2014)

Full Text (IEEE) Scopus Find it@PNU

Reliability of amorphous InGaZnO thin film transistors with low water-absorption passivation layer

Conference

Ishikawa, S.; Miyasako, T.; Katsui, H.; Tanaka, K.; Hamada, K.-i.; Kulchaisit, C.; Fujii, M.; Ishikawa, Y.; Uraoka, Y.

In: 21st International Display Workshops 2014, IDW 2014, 21st International Display Workshops 2014, IDW 2014. (21st International Display Workshops 2014, IDW 2014, 2014, 1:202-204)

Scopus Find it@PNU

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