학술논문
'학술논문'
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1~10
Conference
Kuesters, K.-H.; Ludwig, C.; Mikolajick, T.; Nagel, N.; Specht, M.; Pissors, V.; Schulze, N.; Stein, E.; Willer, J.
2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on. :740-743 Oct, 2006
Conference
Willer, J.; Ludwig, C.; Deppe, J.; Kleint, C.; Riedel, S.; Sachse, J.-U.; Krause, M.; Mikalo, R.; Kamienski, E.S.; Parascandola, S.; Mikolajick, T.; Fischer, J.-M.; Isler, M.; Kuesters, K.-H.; Bloom, I.; Shapir, A.; Lusky, E.; Eitan, B.
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. VLSI technology VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on. :76-77 2004
Academic Journal
Academic Journal
Journal of Electron Microscopy Technique; 1985, Vol. 2 Issue 6, p533-546, 14p
Academic Journal
In: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties . (Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, January 1986, 53(1):141-159)
Academic Journal
In: Journal of Crystal Growth . (Journal of Crystal Growth, May 1985/June 1985, 71(3):514-518)
Academic Journal
In: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties . (Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, December 1984, 50(6):849-856)
Academic Journal
Beug, M. F.; Knoefler, R.; Ludwig, C.; Hagenbeck, R.; Mueller, T.; Riedel, S.; Hoehr, T.; Sachse, J. -U.; Nagel, N.; Mikolajick, T.; Kuesters, K.-H.
Academic Journal
Conference
Amon, J.; Kieslich, A.; Heineck, L.; Schuster, T.; Faul, J.; Luetzen, J.; Fan, C.; Huang, C.-C.; Kudelka, S.; Schroeder, U.; Kuesters, K.-H.; Fischer, B.; Enders, G.; Lange, G.; Alsmeier, J.
In: Technical Digest - International Electron Devices Meeting, IEDM , Technical Digest - IEEE International Electron Devices Meeting, 2004 IEDM (50th Annual Meeting). (Technical Digest - International Electron Devices Meeting, IEDM, 2004, :73-74)
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제한된 항목
[AR] Kuesters, K.-H.
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