학술논문
'학술논문'
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1~10
Academic Journal
Singh, R.; Radu, I.; Reiche, M.; Himcinschi, C.; Kuck, B.; Tillack, B.; Gösele, U.; Christiansen, S.H.
In Applied Surface Science 30 January 2007 253(7):3595-3599
Academic Journal
In: Rapid Communications in Mass Spectrometry . (Rapid Communications in Mass Spectrometry, 30 December 2020, 34(24))
Conference
Knoll, D.; Heinemann, B.; Barth, R.; Blum, K.; Borngraber, J.; Drews, J.; Ehwald, K.-E.; Fischer, G.; Fox, A.; Grabolla, T.; Haak, U.; Hoppner, W.; Korndorfer, F.; Kuck, B.; Marschmeyer, S.; Richter, H.; Rucker, H.; Schley, P.; Schmidt, D.; Scholz, R.; Senapati, B.; Tillack, B.; Winkler, W.; Wolansky, D.; Wolf, C.; Wulf, H.-E.; Yamamoto, Y.; Zaumseil, P.
Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting. :241-244 2004
Conference
Heinemann, B.; Barth, R.; Bolze, D.; Drews, J.; Formanek, P.; Grabolla, T.; Haak, U.; Hoppner, W.; Kopke, D.K.; Kuck, B.; Kurps, R.; Marschmeyer, S.; Richter, H.H.; Rucker, H.; Schley, P.; Schmidt, D.; Winkler, W.; Wolansky, D.; Wulf, H.E.; Yamamoto, Y.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :251-254 2004
Conference
Heinemann, B.; Rucker, H.; Barth, R.; Bauer, J.; Bolze, D.; Bugiel, E.; Drews, J.; Ehwald, K.-E.; Grabolla, T.; Haak, U.; Hoppner, W.; Knoll, D.; Kruger, D.; Kuck, B.; Kurps, R.; Marschmeyer, M.; Richter, H.H.; Schley, P.; Schmidt, D.; Scholz, R.; Tillack, B.; Winkler, W.; Wolnsky, D.; Wulf, H.-E.; Yamamoto, Y.; Zaumseil, P.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :775-778 2002
Conference
Knoll, D.; Ehwald, K.E.; Heinemann, B.; Fox, A.; Blum, K.; Rucker, H.; Furnhammer, F.; Senapati, B.; Barth, R.; Haak, U.; Hoppner, W.; Drews, J.; Kurps, R.; Marschmeyer, S.; Richter, H.H.; Grabolla, T.; Kuck, B.; Fursenko, O.; Schley, P.; Scholz, R.; Tillack, B.; Yamamoto, Y.; Kopke, K.; Wulf, H.E.; Wolansky, D.; Winkler, W.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :783-786 2002
Conference
Schmundt, H.; Knoll, D.; Heinemann, B.; Schley, P.; Winter, H.; Kuck, B.; Schlote, J.; Blum, K.; Kurps, R.; Grabolla, T.; Rucker, H.; Tillack, B.; Bolze, K.D.
28th European Solid-State Device Research Conference Solid-State Device Research Conference, 1998. Proceeding of the 28th European. :260-263 1998
Conference
Fox, A.; Heinemann, B.; Barth, R.; Bolze, D.; Drews, J.; Haak, U.; Knoll, D.; Kuck, B.; Kurps, R.; Marschmeyer, S.; Richter, H.H.; Rucker, H.; Schley, P.; Schmidt, D.; Tillack, B.; Weidner, G.; Wipf, C.; Wolansky, D.; Yamamoto, Y.
2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008
Conference
Rucker, H.; Heinemann, B.; Barth, R.; Bauer, J.; Blum, K.; Bolze, D.; Drews, J.; Fischer, G.G.; Fox, A.; Fursenko, O.; Grabolla, T.; Haak, U.; Hoppner, W.; Knoll, D.; Kopke, K.; Kuck, B.; Mai, A.; Marschmeyer, S.; Morgenstern, T.; Richter, H.H.; Schley, P.; Schmidt, D.; Schulz, K.; Tillack, B.; Weidner, G.; Winkler, W.; Wolansky, D.; Wulf, H.-E.; Yamamototo, Y.
2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :651-654 Dec, 2007
Conference
Knoll, D.; Heinemann, B.; Ehwald, K. E.; Fox, A.; Rucker, H.; Barth, R.; Bolze, D.; Grabolla, T.; Haak, U.; Drews, J.; Kuck, B.; Marschmeyer, S.; Richter, H. H.; Chaimanee, M.; Fursenko, O.; Schley, P.; Tillack, B.; Kopke, K.; Yamamoto, Y.; Wulf, H. E.; Wolansky, D.
2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006
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[AR] Kuck, B.
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