학술논문
'학술논문'
에서 검색결과 25건 | 목록
1~10
Academic Journal
In: Computers in Biology and Medicine . (Computers in Biology and Medicine, September 2024, 180)
Conference
Hapke, F.; Redemund, W.; Schloeffel, J.; Krenz-Baath, R.; Glowatz, A.; Wittke, M.; Hashempour, H.; Eichenberger, S.
2010 IEEE International Test Conference Test Conference (ITC), 2010 IEEE International. :1-10 Nov, 2010
Conference
Hapke, F.; Krenz-Baath, R.; Glowatz, A.; Schloeffel, J.; Hashempour, H.; Eichenberger, S.; Hora, C.; Adolfsson, D.
2009 International Test Conference Test Conference, 2009. ITC 2009. International. :1-10 Nov, 2009
Academic Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 35(12):2104-2117 2016
Conference
In: Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023 , Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023. (Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, 2023, :161-166)
Academic Journal
In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems . (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, December 2016, 35(12):2104-2117)
Conference
2010 15th IEEE European Test Symposium (ETS); 2010, p176-181, 6p
Conference
Jutman, A.; Lotz, C.; Larsson, E.; Reorda, M.S.; Jenihhin, M.; Raik, J.; Kerkhoff, H.; Krenz-Baath, R.; Engelke, P.
In: Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017 , Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. (Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017, 11 May 2017, :115-120)
Conference
In: 2016 11th IEEE International Symposium on Industrial Embedded Systems, SIES 2016 - Proceedings , 2016 11th IEEE International Symposium on Industrial Embedded Systems, SIES 2016 - Proceedings. (2016 11th IEEE International Symposium on Industrial Embedded Systems, SIES 2016 - Proceedings, 11 July 2016)
Conference
Tsertov, A.; Jutman, A.; Devadze, S.; Reorda, M.S.; Cantoro, R.; Montazeri, M.; Larsson, E.; Zadegan, F.G.; Krenz-Baath, R.
In: Proceedings - International Test Conference , Proceedings - 2016 IEEE International Test Conference, ITC 2016. (Proceedings - International Test Conference, 2 July 2016, 0)
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[AR] Krenz-Baath, R.
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