학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 17건 | 목록 1~10
Academic Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 27(6):1308-1321 Jun, 2019
Academic Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 25(12):3464-3472 Dec, 2017
Academic Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 25(4):1444-1454 Apr, 2017
Academic Journal
In: Microelectronics Reliability. (Microelectronics Reliability, August 2018, 87:158-167)
Conference
In: 2022 IEEE 23rd Latin American Test Symposium, LATS 2022, 2022 IEEE 23rd Latin American Test Symposium, LATS 2022. (2022 IEEE 23rd Latin American Test Symposium, LATS 2022, 2022)
Conference
In: Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. (Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020, April 2020)
Conference
In: Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020, March 2020, :1614-1617)
Conference
In: Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019, Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019. (Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019, 14 May 2019, :162-167)
Conference
In: Proceedings of the European Test Workshop, Proceedings - 2019 IEEE European Test Symposium, ETS 2019. (Proceedings of the European Test Workshop, May 2019, 2019-May)
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제한된 항목
[AR] Kraak, D.
발행연도 제한
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