학술논문
'학술논문'
에서 검색결과 27건 | 목록
1~10
Academic Journal
IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 20(3):208-210 Feb, 2008
Academic Journal
In: Optics and Lasers in Engineering . (Optics and Lasers in Engineering, February 2009, 47(2):259-263)
Conference
Proceedings of SPIE; Nov2008 Part 2, Issue 1, p71551Q-71551Q-8, 8p
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Optical Measurement Systems for Industrial Inspection V. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6616(PART 1))
Conference
Berghmans, F.; Van Uffelen, M.; Eve, S.; Ernst, E.; Huber, N.; Kraft, O.; Last, A.; Rabus, D.; Andrei, A.; Nieradko, L.; Krupa, K.; Jozwik, M.; Gorecki, C.; Hirsinger, L.; Delobelle, P.; Kniazewski, P.; Salbut, L.; Kujawinska, M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Reliability of Optical Fiber Components, Devices, Systems, and Networks III. (Proceedings of SPIE - The International Society for Optical Engineering, 2006, 6193)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Optical Micro- and Nanometrology in Microsystems Technology. (Proceedings of SPIE - The International Society for Optical Engineering, 2006, 6188)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Interferometry XIII: Applications. (Proceedings of SPIE - The International Society for Optical Engineering, 2006, 6293)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Nano- and Micro-Metrology. (Proceedings of SPIE - The International Society for Optical Engineering, 2005, 5858:1-8)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II. (Proceedings of SPIE - The International Society for Optical Engineering, 2005, 5878:1-8)
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제한된 항목
[AR] Kniazewski, P.
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