학술논문
'학술논문'
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1~10
Academic Journal
Micromachines, Vol 11, Iss 4, p 364 (2020)
Conference
Proceedings of 1st International Symposium on Plasma Process-Induced Damage Plasma Process-Induced Damage, 1996 1st International Symposium on. :11-14 1996
Conference
In: International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings . (International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings, 2000, :10-13)
Conference
In: International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings . (International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings, 2000, :161-163)
Conference
In: Technical Digest - International Electron Devices Meeting . (Technical Digest - International Electron Devices Meeting, 1999, :719-722)
Conference
In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings . (Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999, :38-42)
Conference
Cheung, Kin P.; Chang, C.-P.; Colonell, J.I.; Lai, W.-Y.-C.; Liu, C.-T.; Liu, R.; Pai, C.-S.; Rafferty, C.S.; Vaidya, H.; Clemens, J.T.
In: Digest of Technical Papers - Symposium on VLSI Technology . (Digest of Technical Papers - Symposium on VLSI Technology, 1998, :198-199)
Conference
In: International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings . (International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings, 1996, :11-14)
Conference
In: Digest of Technical Papers - Symposium on VLSI Technology . (Digest of Technical Papers - Symposium on VLSI Technology, 1995, :83-84)
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제한된 항목
[AR] Kin P. Cheung
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