학술논문
'학술논문'
에서 검색결과 48건 | 목록
1~10
Academic Journal
Trinh, S.; Mergens, M.; Verhaege, K.; Russ, C.; Armer, J.; Jozwiak, P.; Keppens, B.; Mohn, R.; Taylor, G.; De Ranter, F.; Van Camp, B.
In Microelectronics Reliability 2003 43(9):1537-1543
Academic Journal
In Microelectronics Reliability 2002 42(6):901-907
Academic Journal
In Microelectronics Reliability 2001 41(3):375-383
Conference
Mergens, M.; Wybo, G.; Van Camp, B.; Keppens, B.; De Ranter, F.; Verhaege, K.; Jozwiak, P.; Armer, J.; Russ, C.
2005 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and systems Circuits and Systems (ISCAS), 2005 IEEE International Symposium on. :1194-1197 Vol. 2 2005
Conference
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571) Custom integrated circuists Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004. :251-254 2004
Conference
2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) Reliability physics symposium Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International. :253-258 2001
Conference
30th European Solid-State Device Research Conference Solid-State Device Research Conference, 2000. Proceeding of the 30th European. :144-147 2000
Conference
Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) Electrical overstress/electrostatic discharge Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999. :95-104 1999
Academic Journal
Mergens, M.P.J.; Russ, C.C.; Verhaege, K.G.; Armer, J.; Jozwiak, P.C.; Mohn, R.P.; Keppens, B.; Trinh, C.S.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 5(3):532-542 Sep, 2005
Conference
2001 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.. :456-462 Sep, 2001
검색 결과 제한하기
제한된 항목
[AR] Keppens, B.
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