학술논문
'학술논문'
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IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(8):1708-1715 Aug, 2023
Academic Journal
In Microelectronics Reliability November 2020 114
Academic Journal
In Microelectronics Reliability September 2019 100-101
Academic Journal
In Microelectronics Reliability September 2019 100-101
Academic Journal
In Microelectronics Reliability June 2019 97:24-30
Academic Journal
Albandes, I.; Serrano-Cases, A.; Martins, M.; Martínez-Álvarez, A.; Cuenca-Asensi, S.; Kastensmidt, F.L.
In Microelectronics Reliability September 2018 88-90:898-902
Academic Journal
In Microelectronics Reliability September 2018 88-90:111-115
Academic Journal
In Microelectronics Reliability September 2017 76-77:660-664
Academic Journal
In Microelectronics Reliability September 2017 76-77:640-643
Academic Journal
In: IEEE Transactions on Nuclear Science . (IEEE Transactions on Nuclear Science, 2024, :1-1)
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[AR] Kastensmidt, F.L.
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