학술논문
'학술논문'
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1~10
Academic Journal
Chikoidze, E.; Tchelidze, T.; Sartel, C.; Chi, Z.; Kabouche, R.; Madaci, I.; Rubio, C.; Mohamed, H.; Sallet, V.; Medjdoub, F.; Perez-Tomas, A.; Dumont, Y.
In Materials Today Physics December 2020 15
Academic Journal
Rzin, M.; Meneghini, M.; Rampazzo, F.; Zhan, V. Gao; De Santi, C.; Kabouche, R.; Zegaoui, M.; Medjdoub, F.; Meneghesso, G.; Zanoni, E.
In Microelectronics Reliability September 2019 100-101
Conference
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020
Conference
Abid, I.; Kabouche, R.; Medjdoub, F.; Besendorfer, S.; Meissner, E.; Derluyn, J.; Degroote, S.; Germain, M.; Miyake, H.
2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2020 32nd International Symposium on. :310-312 Sep, 2020
Conference
Kabouche, R.; Derluyn, J.; Pusche, R.; Degroote, S.; Germain, M.; Pecheux, R.; Okada, E.; Zegaoui, M.; Medjdoub, F.
2018 13th European Microwave Integrated Circuits Conference (EuMIC) European Microwave Integrated Circuits Conference (EuMIC), 2018 13th. :5-8 Sep, 2018
Academic Journal
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 7:1145-1150 2019
Conference
2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :228-231 Sep, 2017
Conference
2018 International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMIC) Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMIC), 2018 International Workshop on. :1-3 Jul, 2018
Academic Journal
IEEE Microwave and Wireless Components Letters IEEE Microw. Wireless Compon. Lett. Microwave and Wireless Components Letters, IEEE. 27(4):419-421 Apr, 2017
Academic Journal
Gao, Z.H.; Meneghini, M.; Chiocchetta, F.; Rampazzo, F.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Harrouche, K.; Kabouche, R.; Okada, E.; Medjdoub, F.
In: Microelectronics Reliability . (Microelectronics Reliability, August 2021, 123)
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[AR] Kabouche, R.
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