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Academic Journal
Back, B.B ; Baker, M.D; Barton, D.S; Basilev, S; Baum, R; Betts, R.R; Białas, A; Bindel, R; Bogucki, W; Budzanowski, A; Busza, W; Carroll, A; Ceglia, M; Chang, Y.-H; Chen, A.E; Coghen, T; Connor, C; Czyż, W; Da̧browski, B; Decowski, M.P; Despet, M; Fita, P; Fitch, J; Friedl, M; Gałuszka, K; Ganz, R; Garcia, E; George, N; Godlewski, J; Gomes, C; Griesmayer, E; Gulbrandsen, K; Gushue, S; Halik, J; Halliwell, C; Haridas, P; Hayes, A; Heintzelman, G.A; Henderson, C; Hollis, R; Hołyński, R; Hofman, D; Holzman, B; Johnson, E; Kane, J; Katzy, J; Kita, W; Kotuła, J; Kraner, H; Kucewicz, W; Kulinich, P; Law, C; Lemler, M; Ligocki, J; Lin, W.T; Manly, S; McLeod, D; Michałowski, J; Mignerey, A; Mülmenstädt, J; Neal, M; Nouicer, R; Olszewski, A; Pak, R; Park, I.C; Patel, M; Pernegger, H; Plesko, M; Reed, C; Remsberg, L.P; Reuter, M; Roland, C; Roland, G; Ross, D; Rosenberg, L; Ryan, J; Sanzgiri, A; Sarin, P; Sawicki, P; Scaduto, J; Shea, J; Sinacore, J; Skulski, W; Steadman, S.G; Stephans, G.S.F; Steinberg, P; Stra̧czek, A; Stodulski, M; Strȩk, M; Stopa, Z; Sukhanov, A; Surowiecka, K; Tang, J.-L; Teng, R; Trzupek, A; Vale, C; van Nieuwenhuizen, G.J; Verdier, R; Wadsworth, B; Wolfs, F.L.H; Wosiek, B; Woźniak, K; Wuosmaa, A.H; Wysłouch, B; Zalewski, K; Żychowski, P
In Nuclear Inst. and Methods in Physics Research, A 2003 499(2):603-623
Conference
Conference: 3. workshop on radiation-induced and/or process-related electrically active defects in semiconductor-insulator systems,Triangle Park, NC (United States),10-13 Sep 1991; Other Information: PBD: Jan 1992
Conference
Conference: 1991 Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference,Santa Fe, NM (United States),2-9 Nov 1991; Other Information: PBD: Nov 1991
Conference
Conference: 1991 Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference,Santa Fe, NM (United States),2-9 Nov 1991; Other Information: PBD: Nov 1991
Conference
Conference: 3. workshop on radiation-induced and/or process-related electrically active defects in semiconductor-insulator systems,Triangle Park, NC (United States),10-13 Sep 1991; Other Information: PBD: Sep 1991
Conference
Conference: 1990 IEEE nuclear science symposium, Arlington, VA (USA), 23-27 Oct 1990
Conference
Conference: American Nuclear Society winter meeting, Washington, DC, USA, 14 Nov 1982; Other Information: Portions of document are illegible
Report
Other Information: UNCL. Orig. Receipt Date: 30-JUN-73
Conference
Conference: Scanning electron microscopy annual meeting, Anaheim, CA, USA, Apr 1982; Other Information: Portions of docuemnt are illegible
Conference
IEEE Trans. Nucl. Sci.; (United States); 36:1; Conference: IEEE nuclear science symposium, Orlando, FL, USA, 9 Nov 1988
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