학술논문
'학술논문'
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Academic Journal
In: Nano Letters . (Nano Letters, 14 March 2018, 18(3):2081-2085)
Academic Journal
Swider, E.; Staal, A.H.J.; Koen Van Riessen, N.; Jacobs, L.; Van Dinther, E.; Figdor, C.G.; De Vries, I.J.M.; Koshkina, O.; Srinivas, M.; White, P.B.; Fokkink, R.; Janssen, G.-J.
In: RSC Advances . (RSC Advances, 2018, 8(12):6460-6470)
Academic Journal
In: Polymer Chemistry . (Polymer Chemistry, 7 February 2015, 6(5):691-696)
Academic Journal
Derksen, J.; Wolters-Arts, M.; Janssen, G.-J.; Lichtscheidl, I.; Adlassnig, W.; Ovecka, M.; Doris, F.; Steer, M.
In: Plant Journal . (Plant Journal, November 2011, 68(3):495-506)
Academic Journal
In: Clinical Science . (Clinical Science, 1991, 80(5):413-417)
Conference
De Kruif, R.; Janssen, G.-J.; Van Der Heijden, E.; De Haas, P.; Bubke, K.; Peters, J.H.; Dusa, M.; Fochler, J.; Connolly, B.
In: Proceedings of SPIE - The International Society for Optical Engineering , EMLC 2008 - 24th European Mask and Lithography Conference. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6792)
Conference
Finders, J.; Van Der Heijden, E.; Janssen, G.-J.; Vangheluwe, R.; Shibata, T.; Naitou, R.; Kosugi, H.; Sugimachi, H.
In: Proceedings of SPIE - The International Society for Optical Engineering , Optical Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6924)
Conference
Englard, H.; Van Setten, E.; Janssen, G.-J.; Vanoppen, P.; Minnaert-Janssen, I.; Duray, F.; Adan, O.; Moran, A.; Gershtein, L.; Peltinov, R.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6518(PART 2))
Conference
Englard, I.; Piech, R.; Vanoppen, P.; Finders, J.; Minnaert-Janssen, I.; Duray, F.; Meessen, J.; Janssen, G.-J.; Adan, O.; Gershtein, L.; Peltinov, R.; Masia, C.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6518(PART 1))
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제한된 항목
[AR] Janssen, G.-J.
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