학술논문
'학술논문'
에서 검색결과 39건 | 목록
1~10
Conference
ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. Semiconductor Manufacturing Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium on. :390-393 2005
Academic Journal
Adel, M.; Ghinovker, M.; Golovanevsky, B.; Izikson, P.; Kassel, E.; Yaffe, D.; Bruckstein, A.M.; Goldenberg, R.; Rubner, Y.; Rudzsky, M.
IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 17(2):166-179 May, 2004
Conference
2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI. :359-365 May, 2008
Conference
Qin, R.; Qiu, S.; Xia, Y.; Hu, S.; Chang, J.; Zhang, J.; Zhang, W.; Wang, P.; Zhou, X.; Bitincka, E.; Yuan, S.; Drabik, N.; Izikson, P.; Argento, G.; Miceli, G.; Chai, Y.; Liu, Y.; Jiang, J.; Jing, H.; Dai, S.
In: IWAPS 2021 - 2021 5th International Workshop on Advanced Patterning Solutions , IWAPS 2021 - 2021 5th International Workshop on Advanced Patterning Solutions. (IWAPS 2021 - 2021 5th International Workshop on Advanced Patterning Solutions, 2021)
Conference
Chang, J.; Zhang, J.; Zhang, W.; Wang, P.; Zhou, X.; Qin, R.; Hu, S.; Qiu, S.; Xia, Y.; Miceli, G.; Van Der Broek, B.; Yuan, S.; Drabik, N.; Izikson, P.; Argento, G.; Bitincka, E.; Jing, H.; Dai, S.; Chai, Y.; Liu, Y.; Jiang, J.
In: IWAPS 2021 - 2021 5th International Workshop on Advanced Patterning Solutions , IWAPS 2021 - 2021 5th International Workshop on Advanced Patterning Solutions. (IWAPS 2021 - 2021 5th International Workshop on Advanced Patterning Solutions, 2021)
Conference
Feng, Y.; Xuan, P.; Wu, D.; Yang, B.; Xu, C.; Liu, N.; Izikson, P.; Chen, C.; Verstraeten, B.; Wang, A.; Sanguinetti, G.; Miceli, G.; Boter, J.; Van Der Meijden, V.; Li, H.; Mozooni, B.; You, H.; Yan, X.-Z.; Markov, V.; Chai, Y.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Conference
Feng, Y.; Wu, D.; Xuan, P.; Izikson, P.; Venselaar, J.J.; Bottegal, G.; Sanguinetti, G.; Verstraeten, B.; Nooitgedagt, T.; Mozooni, B.; Qi, P.; You, H.; Chai, Y.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2020, 11325)
Conference
Wakamoto, S.; Ishii, Y.; Yasukawa, K.; Sukegawa, A.; Maejima, S.; Kato, A.; Robinson, J. C.; Eichelberger, B. J.; Izikson, P.; Adel, M.
Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65180J-65180J-8, 8p
Conference
Proceedings of SPIE; Nov2007, Issue 1, p682722-682722-10, 10p
Academic Journal
In: Statistics in Medicine . (Statistics in Medicine, 30 June 2003, 22(12):1977-1988)
검색 결과 제한하기
제한된 항목
[AR] Izikson, P.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어