학술논문
'학술논문'
에서 검색결과 39건 | 목록
1~10
Conference
Wen, H.; Warnock, J.; Chan, Y.; Mayer, G.; Truong, B.; Strach, T.; Slegel, T.; Carey, S.; Salem, G.; Malgioglio, F.; Malone, D.; Plass, D.; Curran, B.; Chan, Y.-H.; Mayo, M.; Huott, W.; Mak, P.
2011 IEEE International Conference on IC Design & Technology IC Design & Technology (ICICDT), 2011 IEEE International Conference on. :1-5 May, 2011
Conference
Davis, J.; Plass, D.; Bunce, P.; Chan, Y.; Pelella, A.; Joshi, R.; Chen, A.; Huott, W.; Knips, T.; Patel, P.; Lo, K.; Fluhr, E.
2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International. :2564-2571 2006
Academic Journal
In Microelectronics Reliability August-October 2000 40(8-10):1353-1358
Conference
Warnock, J.; Chan, Y.; Huott, W.; Carey, S.; Fee, M.; Wen, H.; Saccamango, M. J.; Malgioglio, F.; Meaney, P.; Plass, D.; Chan, Y.-H.; Mayo, M.; Mayer, G.; Sigal, L.; Rude, D.; Averill, R.; Wood, M.; Strach, T.; Smith, H.; Curran, B.; Schwarz, E.; Eisen, L.; Malone, D.; Weitzel, S.; Mak, P.-K.; McPherson, T.; Webb, C.
2011 IEEE International Solid-State Circuits Conference Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International. :70-72 Feb, 2011
Academic Journal
Warnock, J.; Chan, Y.-H.; Carey, S.; Wen, H.; Meaney, P.; Gerwig, G.; Smith, H. H.; Chan, Y.; Davis, J.; Bunce, P.; Pelella, A.; Rodko, D.; Patel, P.; Strach, T.; Malone, D.; Malgioglio, F.; Neves, J.; Rude, D. L.; Huott, W.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 47(1):151-163 Jan, 2012
Conference
Huott, W.; McManus, M.; Knebel, D.; Steen, S.; Manzer, D.; Sanda, P.; Wilson, S.; Chan, Y.; Pelella, A.; Polonsky, S.
International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) International test conference Test Conference, 1999. Proceedings. International. :883-891 1999
Conference
Franch, R.; Restle, P.; James, N.; Huott, W.; Friedrich, J.; Dixon, R.; Weitzel, S.; Van Goor, K.; Salem, G.
2008 IEEE International Test Conference Test Conference, 2008. ITC 2008. IEEE International. :1-7 Oct, 2008
Conference
Franch, R.; Restle, P.; James, N.; Huott, W.; Friedrich, J.; Dixon, R.; Weitzel, S.; Van Goor, K.; Salem, G.
2007 IEEE International Test Conference Test Conference, 2007. ITC 2007. IEEE International. :1-7 Oct, 2007
Conference
Joshi, R.; Houle, R.; Batson, K.; Rodko, D.; Patel, P.; Huott, W.; Franch, R.; Chan, Y.; Plass, D.; Wilson, S.; Wang, P.
2007 IEEE Symposium on VLSI Circuits VLSI Circuits, 2007 IEEE Symposium on. :250-251 Jun, 2007
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제한된 항목
[AR] Huott, W.
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