학술논문
'학술논문'
에서 검색결과 19건 | 목록
1~10
Conference
In: BMEiCON 2023 - 15th Biomedical Engineering International Conference , BMEiCON 2023 - 15th Biomedical Engineering International Conference. (BMEiCON 2023 - 15th Biomedical Engineering International Conference, 2023)
Conference
Pu, H.; Zhu, N.; Zhong, S.; Pei, J.; Huang, C.-C.K.; Cheng, Q.; Tong, L.; Wang, C.; Wang, J.; He, H.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Conference
Chung, W.J.; Tristan, J.; Gutjahr, K.; Subramany, L.; Li, C.; Sun, Y.; Yelverton, M.; Kim, Y.K.; Kim, J.S.; Huang, C.-C.K.; Pierson, W.; Karur-Shanmugam, R.; Riggs, B.; Jug, S.; Robinson, J.C.; Yap, L.; Ramanathan, V.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2014, 9050)
Conference
Klein, D.; Amit, E.; Cohen, G.; Amir, N.; Har-Zvi, M.; Huang, C.-C.K.; Karur-Shanmugam, R.; Pierson, B.; Kato, C.; Kurita, H.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVII. (Proceedings of SPIE - The International Society for Optical Engineering, 2013, 8681)
Conference
Huang, C.-C.K.; Chua, L.; Hwang, K.B.; Mani, A.; Marcuccilli, G.; Pierson, B.; Karur-Shanmugam, R.; Robinson, J.C.; Choi, D.; Ferber, M.; Roeth, K.-D.; Lee, B.H.; Lee, I.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVII. (Proceedings of SPIE - The International Society for Optical Engineering, 2013, 8681)
Conference
Huang, C.-Y.; Chiu, C.-F.; Wu, W.-B.; Shih, C.-L.; Huang, C.-C.K.; Pierson, B.; Robinson, J.C.; Huang, H.; Choi, D.S.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2012, 8324)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2012, 8324)
Conference
Pai, Y.C.; Chen, C.; Jang, L.; Chen, H.; Yu, C.-C.; Huang, C.-C.K.; Wu, H.-C.; Robinson, J.C.; Tien, D.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 7971)
Conference
Huang, C.-C.K.; Huang, C.-T.H.; Golotsvan, A.; Tien, D.; Chiu, C.-F.; Huang, C.-Y.; Wu, W.-B.; Shih, C.-L.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 7971)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7638)
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[AR] Huang, C.-C.K.
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