학술논문
'학술논문'
에서 검색결과 18건 | 목록
1~10
Conference
2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2024 IEEE 30th International Symposium on. :1-6 Jul, 2024
Conference
Kritikakou, Angeliki; Sentieys, Olivier; Hubert, Guillaume; Helen, Youri; Coulon, Jean-Francois; Deroux-Dauphin, Patrice
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :819-824 Mar, 2022
Periodical
Voltine, Florian; Miller, Florent; Cheviron, Thibault; Colladant, Thierry; Helen, Youri; Barbot, Laurent
IEEE Transactions on Nuclear Science; August 2024, Vol. 71 Issue: 8 p1940-1947, 8p
Conference
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021 IEEE International Symposium on. :1-4 Oct, 2021
Conference
2020 IEEE 38th International Conference on Computer Design (ICCD) ICCD Conference on Computer Design (ICCD), 2020 IEEE 38th International. :205-212 Oct, 2020
Periodical
IEEE Transactions on Nuclear Science; August 2023, Vol. 70 Issue: 8 p1747-1754, 8p
Academic Journal
Conference
Proceedings of SPIE; Nov2001, Issue 1, p33-37, 5p
Conference
Dassow, Ralf; Köhler, Jürgen R.; Nerding, Melanie; Strunk, Horst P.; Helen, Youri; Mourgues, Karine; Bonnaud, Olivier; Mohammed-Brahim, Tayeb; Werner, Jürgen H.
MRS Online Proceedings Library; 2000, Vol. 621 Issue 1, p1-6, 6p
Periodical
Toutah, H.; Tala-Ighil, B.; Llibre, J.F.; Mohammed-Brahim, T.; Helen, Youri; Gautier, G.; Mourgues, K.; Raoult, F.
Diffusion and Defect Data Part B: Solid State Phenomena; November 2001, Vol. 80 Issue: 1 p343-348, 6p
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[AR] Helen, Youri
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