학술논문
'학술논문'
에서 검색결과 108건 | 목록
1~10
Conference
Ogawa, E.T.; Lee, K.-D.; Matsuhashi, H.; Ko, K.-S.; Justison, P.R.; Ramamurthi, A.N.; Bierwag, A.J.; Ho, P.S.; Blaschke, V.A.; Havemann, R.H.
2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) Reliability physics symposium Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International. :341-349 2001
Conference
Qing-Tang Jiang; Ming-Hsing Tsai; Frank, A.; Parihar, V.; Nowell, M.; Augur, R.A.; Havemann, R.H.; Luttmer, J.D.
2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) Solid-state and integrated circuit technology Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on. 1:400-404 vol.1 2001
Conference
Hong, Q.Z.; Shiau, W.T.; Yang, H.; Kittl, J.A.; Chao, C.P.; Tsai, H.L.; Krishnan, S.; Chen, I.C.; Havemann, R.H.
International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :107-110 1997
Ion metal plasma (IMP) deposited titanium liners for 0.25/0.18 /spl mu/m multilevel interconnections
Conference
Dixit, G.A.; Hsu, W.Y.; Konecni, A.J.; Krishnan, S.; Luttmer, J.D.; Havemann, R.H.; Forster, J.; Yao, G.D.; Narasimhan, M.; Xu, Z.; Ramaswami, S.; Dhen, F.S.; Nulman, J.
International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :357-360 1996
Conference
Dixit, G.A.; Paranjpe, A.; Qi-Zhong Hong; Ting, L.M.; Luttmer, J.D.; Havemann, R.H.; Paul, D.; Morrison, A.; Littau, K.; Eizenberg, M.; Sinha, A.K.
Proceedings of International Electron Devices Meeting Electron devices Electron Devices Meeting, 1995. IEDM '95., International. :1001-1004 1995
Conference
1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 1995. Proceedings of Technical Papers. 1995 International Symposium on. :164-168 1995
Conference
Dixit, G.A.; Chisholm, M.F.; Jain, M.K.; Weaver, T.; Ting, L.M.; Pearch, S.; Mizobuchi, K.; Havemann, R.H.; Dobson, C.D.; Jeffryes, A.I.; Holverson, P.J.; Rich, P.; Butler, D.C.; Hems, J.
Proceedings of 1994 IEEE International Electron Devices Meeting Electron devices Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International. :105-108 1994
Conference
Proceedings of 1994 IEEE International Reliability Physics Symposium Reliability physics Reliability Physics Symposium, 1994. 32nd Annual Proceedings., IEEE International. :173-177 1994
Conference
Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461) Interconnect technology conference Interconnect Technology Conference, 2001. Proceedings of the IEEE 2001 International. :227-229 2001
Conference
Tsai, M.H.; Augur, R.; Blaschke, V.; Havemann, R.H.; Ogawa, E.T.; Ho, P.S.; Yeh, W.K.; Shue, S.L.; Yu, C.H.; Liang, M.S.
Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461) Interconnect technology conference Interconnect Technology Conference, 2001. Proceedings of the IEEE 2001 International. :266-268 2001
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[AR] Havemann, R.H.
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