학술논문
'학술논문'
에서 검색결과 53건 | 목록
1~10
Academic Journal
In: Psychological Assessment . (Psychological Assessment, 16 November 2023, 36(2):162-174)
Academic Journal
In: Journal of Imaging . (Journal of Imaging, December 2021, 7(12))
Conference
Roberts, D.; Johnstone, W.; Sanchez, H.; Mandhana, O.; Spilo, D.; Hayden, J.; Travis, E.; Melnick, B.; Celik, M.; Byoung Woon Min; Edgerton, J.; Raymond, M.; Luckowski, E.; Happ, C.; Martinez, A.; Wilson, B.; Pak Leung; Garnett, T.; Goedeke, D.; Remmel, T.; Ramakrishna, K.; White, B.E., Jr.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :72-75 2005
Conference
Taylor, W.J.; Verret, E.; Capasso, C.; Jen-Yee Nguyen; Le Boi La; Luckowski, E.; Martinez, A.; Happ, C.; Schaeffer, J.; Raymond, M.; Tobin, P.
The Fourth International Workshop on Junction Technology, 2004. IWJT '04. Juction technology Junction Technology, 2004. IWJT '04. The Fourth International Workshop on. :107-112 2004
Conference
Henderson, R.; Zurcher, P.; Duvallet, A.; Happ, C.; Petras, M.; Raymond, M.; Remmel, T.; Roberts, D.; Steimle, B.; Straub, S.; Sparks, T.; Tarabbia, M.; Miller, M.
2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers (IEEE Cat. No.01EX496) Silicon monolithic integrated circuits in RF systems Silicon Monolithic Integrated Circuits in RF Systems, 2001. Digest of Papers. 2001 Topical Meeting on. :71-74 2001
Conference
Zurcher, P.; Alluri, P.; Chu, P.; Duvallet, A.; Happ, C.; Henderson, R.; Mendonca, J.; Kim, M.; Petras, M.; Raymond, M.; Remmel, T.; Roberts, D.; Steimle, B.; Stipanuk, J.; Straub, S.; Sparks, T.; Tarabbia, M.; Thibieroz, H.; Miller, M.
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :153-156 2000
Academic Journal
In: Sensors (Switzerland) . (Sensors (Switzerland), 2 October 2019, 19(20))
Conference
Taylor, W.J.; Capasso, C.; Min, B.; Winstead, B.; Verret, E.; Loiko, K.; Gilmer, D.; Hegde, R.I.; Schaeffer, J.; Luckowski, E.; Martinez, A.; Raymond, M.; Happ, C.; Triyoso, D.H.; Kalpat, S.; Haggag, A.; Roan, D.; Nguyen, J.-Y.; La, L.B.; Hebert, L.; Smith, J.; Jovanovic, D.; Burnett, D.; Foisy, M.; Cave, N.; Tobin, P.J.; Samavedam, S.B.; White, B.E.; Venkatesan, S.
2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006
Academic Journal
In: European Journal of Psychological Assessment . (European Journal of Psychological Assessment, March 2019, 35(2):164-171)
검색 결과 제한하기
제한된 항목
[AR] Happ, C.
발행연도 제한
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