학술논문
'학술논문'
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Academic Journal
Schwank, J. R.; Shaneyfelt, M. R.; McMorrow, D.; Ferlet-Cavrois, V.; Dodd, P. E.; Heidel, D. F.; Marshall, P. W.; Pellish, J. A.; LaBel, K. A.; Rodbell, K. P.; Hakey, M.; Flores, R. S.; Swanson, S. E.; Dalton, S. M.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 57(4):1827-1834 Aug, 2010
Conference
Schepis, D.J.; Assaderaghi, F.; Yee, D.S.; Rausch, W.; Bolam, R.J.; Ajmera, A.C.; Leobandung, E.; Kulkarni, S.B.; Flaker, R.; Sadana, D.; Hovel, H.J.; Kebede, T.; Schiller, C.; Wu, S.; Wagner, L.F.; Saccamango, M.J.; Ratanaphanyarat, S.; Kuang, J.B.; Hsieh, M.C.; Tallman, K.A.; Martino, R.M.; Fitzpatrick, D.; Badami, D.A.; Hakey, M.; Chu, S.F.; Davari, B.; Shahidi, G.G.
International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :587-590 1997
Conference
Conference: Proposed for presentation at the 17th Annual Single Event Effects Symposium held April 15-17, 2008 in Long Beach, CA.
Conference
Digest of Technical Papers.1990 Symposium on VLSI Technology VLSI Technology, 1990. Digest of Technical Papers.1990 Symposium on. :11-12 1990
Conference
Schwank, J.R.; Shaneyfelt, M.R.; McMorrow, D.; Ferlet-Cavrois, V.; Dodd, P.E.; Heidel, D.F.; Marshall, P.W.; Pellish, J.A.; LaBel, K.A.; Rodbell, K.P.; Hakey, M.; Flores, R.S.; Swanson, S.E.; Dalton, S.M.
2009 European Conference on Radiation & Its Effects on Components & Systems (RADECS); 2009, p91-97, 7p
Academic Journal
Journal of Electronic Materials; Jul1982, Vol. 11 Issue 4, p813-830, 18p
Conference
Holmes, S.; Bergendahl, A.; Dunn, D.; Guidry, J.; Hakey, M.; Holland, K.; Horr, R.; Humphrey, D.; Knight, S.; Macaluso, D.; Norris, K.; Poley, D.; Rabidoux, P.; Sturtevant, J.; Writer, D.
In: Proceedings of SPIE - The International Society for Optical Engineering , Electron-Beam, X-Ray, and Ion-Beam Submicrometer Lithographies for Manufacturing II. (Proceedings of SPIE - The International Society for Optical Engineering, 9 July 1992, 1671:57-75)
Conference
Maltabcs, J.G.; Holmes, S.J.; Morrow, J.R.; Barr, R.L.; Hakey, M.; Reynolds, G.; Brunsvold, W.R.; Grant Willson, C.; Clccak, N.; MacDonald, S.; Ito, H.
In: Proceedings of SPIE - The International Society for Optical Engineering , Advances in Resist Technology and Processing VII. (Proceedings of SPIE - The International Society for Optical Engineering, 1 January 1990, 1262:2-7)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering . (Proceedings of SPIE - The International Society for Optical Engineering, 13 September 1982, 334:196-205)
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[AR] Hakey, M.
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