학술논문
'학술논문'
에서 검색결과 421건 | 목록
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Academic Journal
Narayanan, P.; Ambrogio, S.; Okazaki, A.; Hosokawa, K.; Tsai, H.; Nomura, A.; Yasuda, T.; Mackin, C.; Lewis, S.C.; Friz, A.; Ishii, M.; Kohda, Y.; Mori, H.; Spoon, K.; Khaddam-Aljameh, R.; Saulnier, N.; Bergendahl, M.; Demarest, J.; Brew, K.W.; Chan, V.; Choi, S.; Ok, I.; Ahsan, I.; Lie, F.L.; Haensch, W.; Narayanan, V.; Burr, G.W.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(12):6629-6636 Dec, 2021
Academic Journal
Kim, Y.; Seo, S.; Consiglio, S.; Jamison, P.; Higuchi, H.; Rasch, M.; Wu, E.Y.; Kong, D.; Saraf, I.; Catano, C.; Muralidhar, R.; Nguyen, S.; DeVries, S.; Van der Straten, O.; Sankarapandian, M.; Pujari, R.N.; Gasasira, A.; Mcdermott, S.M.; Miyazoe, H.; Koty, D.; Yang, Q.; Yan, H.; Clark, R.; Tapily, K.; Engelmann, S.; Robison, R.R.; Wajda, C.; Mosden, A.; Tsunomura, T.; Soave, R.; Saulnier, N.; Haensch, W.; Leusink, G.; Biolsi, P.; Narayanan, V.; Ando, T.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 42(5):759-762 May, 2021
Academic Journal
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 37(2):19-29 Apr, 2020
Conference
Narayanan, P.; Ambrogio, S.; Okazaki, A.; Hosokawa, K.; Tsai, H.; Nomura, A.; Yasuda, T.; Mackin, C.; Lewis, S. C.; Friz, A.; Ishii, M.; Kohda, Y.; Mori, H.; Spoon, K.; Khaddam-Aljameh, R.; Saulnier, N.; Bergendahl, M.; Demarest, J.; Brew, K. W.; Chan, V.; Choi, S.; Ok, I.; Ahsan, I.; Lie, F. L.; Haensch, W.; Narayanan, V.; Burr, G. W.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Conference
Kim, Y.; Seo, S.-C.; Jamison, P.; Consiglio, S.; Higuchi, H.; Miyazoe, H.; Solomon, P.; Kim, S.; Gokmen, T.; Tapily, K.; Clark, R. D.; Tsunomura, T.; Wajda, C. S.; Haensch, W.; Soave, R.; Leusink, G. J.; Narayanan, V.; Ando, T.
2021 Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2021. :1-2 Jun, 2021
Academic Journal
Proceedings of the IEEE Proc. IEEE Proceedings of the IEEE. 107(1):108-122 Jan, 2019
Conference
Kohda, Y.; Li, Y.; Hosokawa, K.; Kim, S.; Khaddam-Aljameh, R.; Ren, Z.; Solomon, P.; Gokmen, T.; Rajalingam, S.; Baks, C.; Haensch, W.; Leobandung, E.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :36.2.1-36.2.4 Dec, 2020
Conference
Rosenberg, J. C.; Horst, F.; Khater, M.; Anderson, F. G.; Leidy, R.; Barwicz, T.; Gill, D.; Kiewra, E.; Martin, Y.; Orcutt, J. S.; Stricker, A. D.; Whiting, C.; McLean, K.; Porth, B.; Xiong, C.; Feilchenfeld, N.; Giewont, K.; Nummy, K.; Offrein, B. J.; Haensch, W.; Green, W. M. J.
2017 European Conference on Optical Communication (ECOC) Optical Communication (ECOC), 2017 European Conference on. :1-3 Sep, 2017
Conference
Ishii, M.; Kim, S.; Lewis, S.; Okazaki, A.; Okazawa, J.; Ito, M.; Rasch, M.; Kim, W.; Nomura, A.; Shin, U.; Hosokawa, K.; BrightSky, M.; Haensch, W.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :14.2.1-14.2.4 Dec, 2019
Academic Journal
In: Frontiers in Artificial Intelligence . (Frontiers in Artificial Intelligence, 9 May 2022, 5)
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[AR] Haensch, W.
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