학술논문
'학술논문'
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Academic Journal
In Microelectronic Engineering May-June 2008 85(5-6):1059-1061
Academic Journal
Hilton, G.C.; Beall, J.A.; Doriese, W.B.; Duncan, W.D.; Ferreira, L.S.; Irwin, K.D.; Reintsema, C.D.; Ullom, J.N.; Vale, L.R.; Xu, Y.; Zink, B.L.; Parkes, W.; Bunting, A.S.; Dunare, C.C.; Gundlach, A.M.; Stevenson, J.T.M.; Walton, A.J.; Schulte, E.; Corrales, E.; Sienicki, J.P.; Bintley, Dan; Ade, P.A.R.; Sudiwala, Rashmi V.; Woodcraft, Adam L.; Halpern, Mark; Holland, W.; Audley, M.D.; MacIntosh, M.
In Nuclear Inst. and Methods in Physics Research, A 2006 559(2):513-515
Academic Journal
Horsfall, A.B.; dos Santos, J.M.M.; Soare, S.M.; Wright, N.G.; O’Neill, A.G.; Bull, S.J.; Walton, A.J.; Gundlach, A.M.; Stevenson, J.T.M.
In Microelectronics Reliability 2003 43(9):1797-1801
Conference
Shulver, B.J.R.; Bunting, A.S.; Gundlach, A.M.; Haworth, L.I.; Ross, A.W.S.; Snell, A.J.; Stevenson, J.T.M.; Walton, A.J.; Allen, R.A.; Cresswell, M.W.
2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :124-129 2006
Conference
2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :143-148 2006
Conference
Terry, J.G.; Smith, S.; Walton, A.J.; Gundlach, A.M.; Stevenson, J.T.M.; Horsfall, A.B.; Wang, K.; dos Santos, J.M.M.; Soare, S.M.; Wright, N.G.; O'Neill, A.G.; Bull, S.J.
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :69-73 2004
Conference
Dicks, M.H.; Broxton, G.M.; Thomson, J.; Lobban, J.; Gundlach, A.M.; Stevenson, J.T.M.; Walton, A.J.
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :183-187 2004
Conference
dos Santos, J.M.M.; Horsfall, A.B.; Pina, J.C.P.; Wright, N.G.; O'Neill, A.G.; Wang, K.; Soare, S.M.; Bull, S.J.; Terry, J.G.; Walton, A.J.; Gundlach, A.M.; Stevenson, J.T.M.
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :255-258 2004
Academic Journal
Bodammer, G.; Vass, D.G.; Underwood, I.; Calton, D.W.; Miremont, C.; Zheng, W.; Stevenson, J.T.M.; Gundlach, A.M.; Walton, A.J.
In Smart Materials Bulletin 2000 2000(12):5-8
Conference
Horsfall, A.B.; dos Santos, J.M.M.; Soare, S.M.; Wright, N.G.; O'Neill, A.G.; Bull, S.J.; Walton, A.J.; Gundlach, A.M.; Stevenson, J.T.M.
ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :115-118 2003
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[AR] Gundlach, A.M.
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