학술논문
'학술논문'
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1~10
Conference
Haimson, Or; Goldman, Roy; Wong, Michael; Sidorov, Oleg; Donnet, David; Tien, David; Ahlgren, Debbora; Leslie, Neel; Jensen, Jake
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2020 IEEE International Symposium on the. :1-4 Jul, 2020
Academic Journal
Dissertation/ Thesis
Dissertation Abstracts International; Dissertation Abstract International; 61-09B.
Conference
Proceedings of the 2000 ACM SIGMOD international conference on Management of data. :285-296
Academic Journal
ACM SIGMOD Record. 26(3):54-66
News
PARNELL, PETER; RICHARDSON, JUSTIN; ADLER, JUDITH LOWITZ; GOLDMAN, ROY; BARRAN, BARBARA; HUSEBY, JANET; GREEN, MARK; WACHTER, ORALEE
Academic Journal
Applied Surface Science. April 1, 2009, Vol. 255 Issue 12, p6183, 7 p.
Conference
Proceedings of the 2000 ACM SIGMOD International Conference: Management of Data; 5/15/2000, p285-296, 12p
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[AR] Goldman, Roy
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