학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 20건 | 목록 1~10
Conference
Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :255-261 2004
Conference
Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2001. IPFA 2001. Proceedings of the 2001 8th International Symposium on the. :42-49 2001
Conference
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) Reliability physics Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International. :420-424 2000
Conference
1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) Reliability physics Reliability Physics Symposium Proceedings, 1999. 37th Annual. 1999 IEEE International. :327-332 1999
Conference
2005 Electrical Overstress/Electrostatic Discharge Symposium; 2005, p1-7, 7p
Academic Journal
In: Microelectronics Reliability. (Microelectronics Reliability, August 2001, 41(8):1237-1242)
Academic Journal
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. (Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 1999, 17(6):2730-2733)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2001, :171-177)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2000, :17-21)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 1996: Conference Proceedings from the 22nd International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 1996, 1996-November:177-182)
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제한된 항목
[AR] Gilfeather, G.
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