학술논문
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1~10
Conference
2022 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2022 IEEE. :1-7 Oct, 2022
Academic Journal
Wolfbeis, Otto S.; Smith, A. M.; Imhof, R. E.; Birch, D. J. S.; Thornley, F. R.; Gilchrist, J. R.; Berry, T.; Macleod, K. C.; Greenfield, Stanley; Thomsen, Maryanne
Analytical Proceedings; Jan1987, Vol. 24 Issue 1, p14-24, 11p
Periodical
Applied Physics B: Lasers and Optics; May 1987, Vol. 43 Issue: 1 p23-28, 6p
Academic Journal
Journal of Physics E: Scientific Instruments; Apr1987, Vol. 20 Issue 4, p1-1, 1p
Academic Journal
Journal of Physics E: Scientific Instruments; Jun1984, Vol. 17 Issue 6, p1-1, 1p
Academic Journal
Journal of Physics D: Applied Physics; Oct1986, Vol. 19 Issue 10, p1-1, 1p
검색 결과 제한하기
제한된 항목
[AR] Gilchrist, J. R.
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