학술논문

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발행년	- (예 : 2010-2015)

전체선택

Transmission line pulse (TLP) as integrative method for the investigation of ultra-fast trapping mechanisms on high-k MIM

Academic Journal

Merlo, L.; Rossetto, I.; Cerati, L.; Ghidini, G.; Milani, A.; Toia, F.; Piagge, R.; Di Biccari, L.; Gevinti, E.; Croce, G.; Andreini, A.

In Microelectronics Reliability September 2019 100-101

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

Novel 190V LIGBT-based ESD protection for 0.35μm Smart Power technology realized on SOI substrate.

Conference

Gevinti, E.; Cerati, L.; Sambi, M.; Dissegna, M.; Cecchetto, L.; Andreini, A.; Tazzoli, A.; Meneghesso, G.

EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium; 2008, p211-220, 10p

Full Text (IEEE) Find it@PNU

3D phase-matching conditions for the generation of entangled triplets by χ(2) interlinked interactions

Academic Journal

Bondani, M.; Allevi, A.; Gevinti, E.; Agliati, A.; Andreoni, A.

In: Optics Express. (Optics Express, 16 October 2006, 14(21):9838-9843)

Full Text (OSA) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

EDA checker for identification of Excessive ESD Voltage Drop - Implementation to Smart Power IC's

Conference

Gevinti, E.; Cerati, L.; Andreini, A.; Di Biccari, L.; Merlo, L.; Salzone, G.; Angeli, S.; Bogani, A.

In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 18 October 2017)

Full Text (IEEE) Scopus Find it@PNU

Schematic-level and layout-level ESD EDA check methodology applied to smart power IC's - Initialization and implementation

Conference

Gevinti, E.; Cerati, L.; Di Biccari, L.; Ballarin, G.; Andreini, A.; Fragnoli, M.; Bogani, A.

In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 30 October 2015, 2015-October)

Full Text (IEEE) Scopus Find it@PNU

HBM ESD EDA check method applied to complete smart power IC's - Functional initialization and implementation

Conference

Gevinti, E.; Cerati, L.; Andreini, A.; Fragnoli, M.; Bogani, A.

In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 16 October 2013)

Full Text (IEEE) Scopus Find it@PNU

CDM circuit simulation of a HV operational amplifier realized in 0.35um smart power technology

Conference

Dissegna, M.; Cerati, L.; Cecchetto, L.; Gevinti, E.; Andreini, A.; Tazzoli, A.; Meneghesso, G.

In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 2007, :1B.31-1B.310)

Full Text (IEEE) Scopus Find it@PNU

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