학술논문
'학술논문'
에서 검색결과 110건 | 목록
1~10
Academic Journal
In Microelectronics Reliability 2005 45(9):1471-1475
Academic Journal
Fluhr, E. J.; Baumgartner, S.; Boerstler, D.; Bulzacchelli, J. F.; Diemoz, T.; Dreps, D.; English, G.; Friedrich, J.; Gattiker, A.; Gloekler, T.; Gonzalez, C.; Hibbeler, J. D.; Jenkins, K. A.; Kim, Y.; Muench, P.; Nett, R.; Paredes, J.; Pille, J.; Plass, D.; Restle, P.; Robertazzi, R.; Shan, D.; Siljenberg, D.; Sperling, M.; Stawiasz, K.; Still, G.; Toprak-Deniz, Z.; Warnock, J.; Wiedemeier, G.; Zyuban, V.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 50(1):10-23 Jan, 2015
Academic Journal
Warnock, J.; Chan, Y.; Harrer, H.; Carey, S.; Salem, G.; Malone, D.; Puri, R.; Zitz, J. A.; Jatkowski, A.; Strevig, G.; Datta, A.; Gattiker, A.; Bansal, A.; Mayer, G.; Chan, Y.-H.; Mayo, M.; Rude, D. L.; Sigal, L.; Strach, T.; Smith, H. H.; Wen, H.; Mak, P.-K.; Shum, C.-L.; Plass, D.; Webb, C.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 49(1):9-18 Jan, 2014
Conference
2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :87-92 2006
Conference
2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :309-318 2004
Conference
International Test Conference, 2003. Proceedings. ITC 2003. International test conference Test Conference, 2003. Proceedings. ITC 2003. International. 1:856-865 2003
Conference
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) VLSI test symposium VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE. :357-362 2002
Conference
Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design Quality electronic design Quality Electronic Design, 2001 International Symposium on. :437-442 2001
Conference
Proceedings International Test Conference 2001 (Cat. No.01CH37260) International test conference Test Conference, 2001. Proceedings. International. :395-404 2001
Conference
Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) International test conference 2000 Test Conference, 2000. Proceedings. International. :454-463 2000
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제한된 항목
[AR] Gattiker, A.
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