학술논문
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Academic Journal
Safranski, C.; Hu, G.; Sun, J.Z.; Hashemi, P.; Brown, S.L.; Buzi, L.; D'Emic, C.P.; Edwards, E.R.J.; Galligan, E.; Gottwald, M.G.; Gunawan, O.; Karimeddiny, S.; Jung, H.; Kim, J.; Latzko, K.; Trouilloud, P.L.; Worledge, D.C.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):7180-7183 Dec, 2022
Conference
Hu, G.; Safranski, C.; Sun, J. Z.; Hashemi, P.; Brown, S. L.; Bruley, J.; Buzi, L.; D'Emic, C. P.; Galligan, E.; Gottwald, M. G.; Gunawan, O.; Lee, J.; Karimeddiny, S.; Trouilloud, P. L.; Worledge, D. C.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :10.2.1-10.2.4 Dec, 2022
Conference
Safranski, C.; Hu, G.; Sun, J. Z.; Hashemi, P.; Brown, S. L.; Buzi, L.; D'Emic, C. P.; Edwards, E. R. J.; Galligan, E.; Gottwald, M. G.; Gunawan, O.; Karimeddiny, S.; Jung, H.; Kim, J.; Latzko, K.; Trouilloud, P. L.; Zare, S.; Worledge, D. C.
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :288-289 Jun, 2022
Conference
Hu, G.; Lauer, G.; Sun, J. Z.; Hashemi, P.; Safranski, C.; Brown, S. L.; Buzi, L.; Edwards, E. R. J.; D'Emic, C. P.; Galligan, E.; Gottwald, M. G.; Gunawan, O.; Jung, H.; Kim, J.; Latzko, K.; Nowak, J. J.; Trouilloud, P. L.; Zare, S.; Worledge, D. C.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :2.5.1-2.5.4 Dec, 2021
Conference
Shih, D.-Y.; Yeh, H.; Narayan, C.; Lewis, J.; Graham, W.; Nunes, S.; Paraszczak, J.; McGouey, R.; Galligan, E.; Cataldo, J.; Serino, R.; Perfecto, E.; Chang, C.-A.; Deutsch, A.; Rothman, L.; Ritsko, J.; Wilczynski, J.
1992 Proceedings 42nd Electronic Components & Technology Conference Electronic Components and Technology Conference, 1992. Proceedings., 42nd. :1002-1014 1992
Conference
Paraszczak, J.; Cataldo, J.; Galligan, E.; Graham, W.; McGouey, R.; Nunes, S.; Serino, R.; Shih, D.Y.; Babich, E.; Deutsch, A.; Kopcsay, G.; Goldblatt, R.; Hofer, D.; Labadie, J.; Hedrick, J.; Narayan, C.; Saenger, K.; Shaw, J.; Ranieri, V.; Ritsko, J.; Rothman, L.; Volksen, W.; Wilczynski, J.; Witman, D.; Yeh, H.
1991 Proceedings 41st Electronic Components & Technology Conference Electronic Components and Technology Conference, 1991. Proceedings., 41st. :362-369 1991
Academic Journal
In Journal of Investigative Dermatology September 2018 138(9):B12-B12
Book
In: Career Options in the Pharmaceutical and Biomedical Industry: An Insider’s Guide . (Career Options in the Pharmaceutical and Biomedical Industry: An Insider’s Guide, 1 January 2023, :249-262)
Factors affecting the interconnection resistance and yield in multilayer polyimide/copper structures
Academic Journal
Shih, D.-Y.; Yeh, H.L.; Paraszczak, J.; Lewis, J.; Graham, W.; Nunes, S.; Narayan, C.; McGouey, R.; Galligan, E.; Cataldo, J.; Serino, R.; Perfecto, E.; Chang, C.-A.; Deutsch, A.; Rothman, L.; Ritsko, J.J.; Wilczynski, J.S.
IEEE Transactions on Components, Hybrids, and Manufacturing Technology IEEE Trans. Comp., Hybrids, Manufact. Technol. Components, Hybrids, and Manufacturing Technology, IEEE Transactions on. 16(1):74-88 Feb, 1993
Conference
Gallagher, W.J.; Abraham, D.; Assefa, S.; Brown, S.L.; DeBrosse, J.; Gaidis, M.; Galligan, E.; Gow, E.; Hughes, B.; Hummel, J.; Kanakasabapathy, S.; Kaiser, C.; Lamorey, M.; Maffit, T.; Milkove, K.; Yu Lu; Nowak, J.; Rice, P.; Samant, M.; O'Sullivan, E.; Parkin, S.S.P.; Robertazzi, R.; Trouilloud, P.; Worledge, D.; Wright, G.; See-Hun Yang
IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech). VLSI Technology VLSI Technology, 2005. (VLSI-TSA-Tech). 2005 IEEE VLSI-TSA International Symposium on. :72-73 2005
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[AR] Galligan, E.
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