학술논문

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발행년	- (예 : 2010-2015)

Electrical Stability of MOS Structures With AlON and Al₂O₃ Dielectrics Deposited on n- and p-Type GaN

Academic Journal

Filho, W.G.; Borga, M.; Geens, K.; Khan, M.A.; Cingu, D.; Chatterjee, U.; Decoutere, S.; Knaepen, W.; Kizir, S.; Arnou, P.; Bakeroot, B.

IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(9):5212-5217 Sep, 2024

Full Text (IEEE) Web of Science JCR 저널정보 Scopus Find it@PNU

Route Toward Commercially Manufacturable Vertical GaN Devices

Academic Journal

Geens, K.; Borga, M.; Khan, M.A.; Filho, W.G.; Vohra, A.; Banerjee, S.; Lee, K.J.; Chatterjee, U.; Cingu, D.; Bakeroot, B.; Decoutere, S.

IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1488-1493 Mar, 2024

Full Text (IEEE) Web of Science JCR 저널정보 Scopus Find it@PNU

Mg activation anneal of the p-GaN body in trench gate MOSFETs and its effect on channel mobility and threshold voltage stability

Academic Journal

Filho, W.G.; Borga, M.; Geens, K.; Khan, M.A.; Cingu, D.; Chatterjee, U.; Vohra, A.; Decoutere, S.; Bakeroot, B.

In: Applied Physics Letters. (Applied Physics Letters, 11 March 2024, 124(11))

Full Text (AIP) Web of Science JCR 저널정보 Scopus Find it@PNU

High- Temperature PBTI in Trench-Gate Vertical GaN Power MOSFETs: Role of Border and Semiconductor Traps

Conference

Favero, D.; Cavaliere, A.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Meneghini, M.; Borga, M.; Geens, K.; Decoutere, S.; Filho, W.G.; Bakeroot, B.

In: IEEE International Reliability Physics Symposium Proceedings, 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, 2023, 2023-March)

Full Text (IEEE) Scopus Find it@PNU

AlON gate dielectric and gate trench cleaning for improved reliability of vertical GaN MOSFETs

Conference

Filho, W.G.; Borga, M.; Geens, K.; Cingu, D.; Chatterjee, U.; You, S.; Decoutere, S.; Bakeroot, B.; Knaepen, W.; Arnou, P.; Homm, P.

In: ETG-Fachbericht. (ETG-Fachbericht, 2022, 2022-March(165):414-418)

Scopus Find it@PNU

Two-stage amplifier design based on experimental Line-Tunnel FET data

Conference

Filho, W.G.; Martino, J.A.; Rangel, R.; Agopian, P.G.D.; Simoen, E.; Collaert, N.; Rooyackers, R.; Claeys, C.

In: 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2019, 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2019. (2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2019, 14 October 2019)

Full Text (IEEE) Scopus Find it@PNU

Output conductance at saturation like region on Line-TFET for different dimensions

Conference

Filho, W.G.; Martino, J.A.; Agopian, P.G.D.

In: SBMicro 2019 - 34th Symposium on Microelectronics Technology and Devices, SBMicro 2019 - 34th Symposium on Microelectronics Technology and Devices. (SBMicro 2019 - 34th Symposium on Microelectronics Technology and Devices, August 2019)

Full Text (IEEE) Scopus Find it@PNU

Comparative studies on the ability of the dialysate from the total RNA of Rhodnius prolixus in protecting the 26S ribosomal RNA of insects from thermal dissociation

Academic Journal

Filho, W.G.; da Silva Passos Jr., G.A.; De Lucca, F.L.

In: Comparative Biochemistry and Physiology -- Part B: Biochemistry and. (Comparative Biochemistry and Physiology -- Part B: Biochemistry and, 1981, 70(4):825-827)

Full Text (ScienceDirect) Scopus Find it@PNU

Comparative studies on the thermal stability of animal ribosomal RNA's-VI. The 28S ribosomal RNA of Rhodnius prolixus is heat-dissociable only after its purification

Academic Journal

Ishikawa, H.; Filho, W.G.; da Silva Passos Jr., G.A.; de Lucca, F.L.

In: Comparative Biochemistry and Physiology -- Part B: Biochemistry and. (Comparative Biochemistry and Physiology -- Part B: Biochemistry and, 1981, 68(3):377-381)

Full Text (ScienceDirect) Scopus Find it@PNU

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