학술논문
'학술논문'
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1~10
Academic Journal
Emprin, B.; Troussel, Ph.; Soullié, G.; Stemmler, Ph.; Mercère, P.; Meltchakov, E.; Jérôme, A.; Delmotte, F.
In Thin Solid Films 1 April 2014 556:54-60
Academic Journal
Rubery, M. S.; Ose, N.; Schneider, M.; Moore, A. S.; Carrera, J.; Mariscal, E.; Ayers, J.; Bell, P.; Mackinnon, A.; Bradley, D.; Landen, O. L.; Thompson, N.; Carpenter, A.; Winters, S.; Ehrlich, B.; Sarginson, T.; Rendon, A.; Liebman, J.; Johnson, K.; Merril, D.; Grant, G.; Shingleton, N.; Taylor, A.; Ruchonnet, G.; Stanley, J.; Cohen, M.; Kohut, T.; Issavi, R.; Norris, J.; Wright, J.; Stevers, J.; Masters, N.; Latray, D.; Kilkenny, J.; Stolte, W. C.; Conlon, C. S.; Troussel, Ph.; Villette, B.; Emprin, B.; Wrobel, R.; Lejars, A.; Chaleil, A.; Bridou, F.; Delmotte, F.
Academic Journal
Emprin, B.; Troussel, Ph.; Soullié, G.; Stemmler, Ph.; Meltchakov, E.; Jérôme, A.; Delmotte, F.; Mercère, P.
In: Optics Express . (Optics Express, 20 October 2014, 22(21):25853-25865)
Academic Journal
Troussel, Ph.; Villette, B.; Emprin, B.; Oudot, G.; Tassin, V.; Bridou, F.; Delmotte, F.; Krumrey, M.
In: Review of Scientific Instruments . (Review of Scientific Instruments, January 2014, 85(1))
Periodical
Juha, Libor; Bajt, Saša; London, Richard; Hudec, René; Pina, Ladislav; Emprin, B.; Troussel, Ph.; Villette, B.; Delmotte, F.
Proceedings of SPIE; May 2013, Vol. 8777 Issue: 1 p87771B-87771B-6, 789946p
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Damage to VUV, EUV, and X-Ray Optics IV; and EUV and X-Ray Optics: Synergy Between Laboratory and Space III. (Proceedings of SPIE - The International Society for Optical Engineering, 2013, 8777)
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[AR] Emprin, B.
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