학술논문
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Academic Journal
In Microelectronics Reliability 2003 43(2):243-248
Conference
2012 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. :146-151 Mar, 2012
Low cost wafer level parallel test strategy for reliability assessments in sub-32nm technology nodes
Conference
2011 IEEE ICMTS International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2011 IEEE International Conference on. :31-34 Apr, 2011
Conference
2008 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on. :137-141 Mar, 2008
Academic Journal
Academic Journal
Academic Journal
IEEE Electron Device Letters; Dec2002, Vol. 23 Issue 12, p737, 3p, 4 Graphs
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제한된 항목
[AR] Dieudonne, Francois
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