학술논문
'학술논문'
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Academic Journal
Ziaur Rahaman, Sk.; Chang, Yao-Jen; Hsin, Yu-Chen; Yang, Shan-Yi; Lee, Hsin-Han; Wang, I-Jung; Chen, Guan-Long; Su, Yi-Hui; Wei, Jeng-Hua; Sheu, Shyh-Shyuan; Lo, Wei-Chung; Deng, Duan-Li; Chang, Shih-Chieh
In Journal of Magnetism and Magnetic Materials 1 January 2023 565
Conference
Rahaman, Sk Ziaur; Hsin, Yu-Chen; Yang, Shan-Yi; Chang, Yao-Jen; Lee, Hsin-Han; Chen, Kuan-Ming; Wang, I-Jung; Chen, Guan-Long; Su, Yi-Hui; Shih, Cheng-Yi; Chiu, Shih-Ching; Wang, Chih-Yao; Wei, Jeng-Hua; Sheu, Shyh-Shyuan; Lo, Wei-Chung; Deng, Duan-Li; Chang, Shih-Chieh
2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) Technology, Systems and Applications (VLSI-TSA/VLSI-DAT), 2023 International VLSI Symposium on. :1-2 Apr, 2023
Academic Journal
Rahaman, Sk. Ziaur; Chang, Yao-Jen; Hsin, Yu-Chen; Yang, Shan-Yi; Lee, Hsin-Han; Wang, I. -Jung; Chen, Guan-Long; Su, Yi-Hui; Wei, Jeng-Hua; Sheu, Shyh-Shyuan; Lo, Wei -Chung; Deng, Duan-Li; Chang, Shih-Chieh
Conference
Wang, Yung-Hung; Huang, Sheng-Huang; Wang, Ding-Yeong; Shen, Kuei-Hung; Chien, Cheng-Wei; Kuo, Keng-Ming; Yang, Shan-Yi; Deng, Duan-Li
2012 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2012 IEEE International. :29.2.1-29.2.4 Dec, 2012
Academic Journal
Rahaman, Sk. Ziaur; Wang, I-Jung; Chen, Tian-Yue; Pai, Chi-Feng; Wang, Ding-Yeong; Wei, Jeng-Hua; Lee, Hsin-Han; Hsin, Yu-Chen; Chang, Yao-Jen; Yang, Shan-Yi; Kuo, Yi-Ching; Su, Yi-Hui; Chen, Yu-Sheng; Huang, Keh-Ching; Wu, Chih-I; Deng, Duan-Li
IEEE Electron Device Letters; Sep2018, Vol. 39 Issue 9, p1306-1309, 4p
Academic Journal
Chien, Cheng-Wei; Wang, Ding-Yeong; Huang, Sheng-Huang; Shen, Kuei-Hung; Yang, Shan-Yi; Shyu, Jia-Hong; Lo, Chiung-Yu; Kuo, Keng-Ming; Chen, Young-Shying; Wang, Yung-Hung; Ku, Tzu-Kun; Deng, Duan-Li
IEEE Electron Device Letters; Jul2014, Vol. 35 Issue 7, p738-740, 3p
Academic Journal
Chien, Cheng-Wei; Wang, Ding-Yeong; Shen, Kuei-Hung; Huang, Sheng-Huang; Kuo, Keng-Ming; Yang, Shan-Yi; Wang, Yung-Hung; Ku, Tzu-Kun; Deng, Duan-Li
IEEE Electron Device Letters; Feb2013, Vol. 34 Issue 2, p241-243, 3p
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[AR] Deng, Duan-Li
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