학술논문
'학술논문'
에서 검색결과 149건 | 목록
1~10
Academic Journal
Houshmand, P.; Sarda, G.M.; Jain, V.; Ueyoshi, K.; Papistas, I.A.; Shi, M.; Zheng, Q.; Bhattacharjee, D.; Mallik, A.; Debacker, P.; Verkest, D.; Verhelst, M.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 58(1):203-215 Jan, 2023
Academic Journal
Nibhanupudi, S.S.T.; Prasad, D.; Das, S.; Zografos, O.; Robinson, A.; Gupta, A.; Spessot, A.; Debacker, P.; Verkest, D.; Ryckaert, J.; Hellings, G.; Myers, J.; Cline, B.; Kulkarni, J.P.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(8):4453-4459 Aug, 2022
Academic Journal
IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 69(7):3084-3089 Jul, 2022
Academic Journal
Yang, S.; Bhattacharjee, D.; Kumar, V.B.Y.; Chatterjee, S.; De, S.; Debacker, P.; Verkest, D.; Mallik, A.; Catthoor, F.
IEEE Journal on Emerging and Selected Topics in Circuits and Systems IEEE J. Emerg. Sel. Topics Circuits Syst. Emerging and Selected Topics in Circuits and Systems, IEEE Journal on. 12(2):508-521 Jun, 2022
Academic Journal
Chen, R.; Chen, L.; Liang, J.; Cheng, Y.; Elloumi, S.; Lee, J.; Xu, K.; Georgiev, V.P.; Ni, K.; Debacker, P.; Asenov, A.; Todri-Sanial, A.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(4):432-439 Apr, 2022
Academic Journal
Chen, R.; Chen, L.; Liang, J.; Cheng, Y.; Elloumi, S.; Lee, J.; Xu, K.; Georgiev, V.P.; Ni, K.; Debacker, P.; Asenov, A.; Todri-Sanial, A.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(4):440-448 Apr, 2022
The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits
Academic Journal
Kaczer, B.; Franco, J.; Weckx, P.; Roussel, Ph.J.; Simicic, M.; Putcha, V.; Bury, E.; Cho, M.; Degraeve, R.; Linten, D.; Groeseneken, G.; Debacker, P.; Parvais, B.; Raghavan, P.; Catthoor, F.; Rzepa, G.; Waltl, M.; Goes, W.; Grasser, T.
In Solid State Electronics November 2016 125:52-62
Conference
2021 19th IEEE International New Circuits and Systems Conference (NEWCAS) New Circuits and Systems Conference (NEWCAS), 2021 19th IEEE International. :1-4 Jun, 2021
Academic Journal
Doevenspeck, J.; Degraeve, R.; Fantini, A.; Cosemans, S.; Mallik, A.; Debacker, P.; Verkest, D.; Lauwereins, R.; Dehaene, W.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(5):2301-2305 May, 2021
Academic Journal
Saito, D.; Doevenspeck, J.; Cosemans, S.; Oh, H.; Perumkunnil, M.; Papistas, I.A.; Belmonte, A.; Rassoul, N.; Delhougne, R.; Kar, G.; Debacker, P.; Mallik, A.; Verkest, D.; Na, M.H.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(11):4616-4620 Nov, 2020
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[AR] Debacker, P.
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