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발행년	- (예 : 2010-2015)

전체선택

Experimental investigation of performance improvement by co-propagating Raman amplification in repeaterless systems

Conference

Davenet, M.; Manach, L.; Favre, F.; Merlaud, F.; Leguen, D.; Billes, L.; Georges, T.

2002 28TH European Conference on Optical Communication Optical Communication, 2002. ECOC 2002. 28th European Conference on. 3:1-2 2002

Full Text (IEEE) Find it@PNU

Modular EUV source for the next generation lithography

Academic Journal

Sublemontier, O.; Rosset-Kos, M.; Ceccotti, T.; Hergott, J.-F.; Auguste, T.; Normand, D.; Schmidt, M.; Le Caro, J.-M.; Beaumont, F.; Farcage, D.; Cheymol, G.; Cormont, P.; Mauchien, P.; Thro, P.-Y.; Skrzypczak, J.; Muller, S.; Marquis, E.; Barthod, B.; Gaurand, I.; Davenet, M.; Bernard, R.

In: Journal of Laser Micro Nanoengineering. (Journal of Laser Micro Nanoengineering, 2011, 6(2):113-118)

Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

New methods and processes based on advanced vacuum technology for photomask decontamination.

Conference

Foray, J. M.; Bellet, B.; HadjRabah, S.; Palisson, J.; Veran, E.; Davenet, M.; Favre, A.; Sergent, P.; Tissier, M.; Baudiquez, V.; Nesladek, P.; Foca, E.; Gopalakrishnan, S.; Hollein, I.; Dufaye, F.; Gough, S.

Proceedings of SPIE; Nov2009 Part 3, Issue 1, p74700A-74700A-11, 11p

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Innovative processes investigation for photomask pod conditioning and drying.

Conference

Foray, J. M.; Rude, C.; Palisson, J.; Davenet, M.; Favre, A.; Cheung, D.; Dufaye, F.; Gough, S.; Richteiger, P.; Baudiquez, V.; Foca, E.; Nesladek, P.; Gopalakrishnan, S.; Avary, K.; Höllein, I.

Proceedings of SPIE; Nov2009, Issue 1, p747010-747010-6, 6p

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Benchmark and gap analysis of current mask carriers vs future requirements: example of the carrier contamination.

Conference

Fontaine, H.; Davenet, M.; Cheung, D.; Hoellein, I.; Richsteiger, P.; Dejaune, P.; Torsy, A.

Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65330W-65330W-8, 8p

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Advanced vacuum wafer drying for thermal laser separation dicing assessment results from european collaborative "SEAL" project

Book

le Barillec, O.; Davenet, M.; Favre, A.; Bellet, B.; Koitzsch, M.; Lewke, D.; Schellenberger, M.; Zühlke, H.-U.

In: Ultra Clean Processing of Semiconductor Surfaces XI. (Solid State Phenomena, 2013, 195:252-257)

Scopus Find it@PNU

Assessment of molecular contamination in mask pod

Conference

Foray, J.M.; Davenet, M.; Favre, A.; Trautmann, T.; Fontaine, H.; Dejaune, P.; Sergent, P.; Gough, S.; Cheung, D.; Tissier, M.; Veillerot, M.; Hollein, I.; Lerit, R.; Rude, C.; Avary, K.

In: Proceedings of SPIE - The International Society for Optical Engineering, EMLC 2008 - 24th European Mask and Lithography Conference. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6792)

Scopus Find it@PNU

Optimal dispersion management for Nx40 Gbit/s DWDM long-haul transmissions with distributed Raman amplification

Conference

Davenet, M.; Le Meur, G.; Dany, B.; Hamoir, D.; du Mouza, L.; Wabnitz, S.; Hamaide, J.P.

In: Optics InfoBase Conference Papers, Nonlinear Guided Waves and Their Applications, NLGW 2001. (Optics InfoBase Conference Papers, 2001, :349-351)

Scopus Find it@PNU

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