학술논문
'학술논문'
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1~10
Academic Journal
Erickson, W.B.; Brown, C.; Portch, E.; Lampinen, J.M.; Marsh, J.E.; Fodarella, C.; Petkovic, A.; Coultas, C.; Newby, A.; Date, L.; Frowd, C.D.; Hancock, P.J.B.
In: Psychology, Crime and Law . (Psychology, Crime and Law, 2024, 30(3):207-228)
Academic Journal
Breuil, L.; Van den bosch, G.; Cacciato, A.; Date, L.; Kar, G.S.; Tang, B.; Arreghini, A.; Debusschere, I.; Van Houdt, J.
In Microelectronic Engineering 2011 88(7):1164-1167
Conference
Vyas, P.B.; Megalini, L.; Pal, A.; Holt, J.; Kumar, A.; Weeks, S.; Zhao, C.; Date, L.; Lo, H.; Khoury, M.; Muhammad, S.; Piallat, F.; Fang, R.; Charles, W.; Palit, P.; Yang, J.; Zhang, Q.; Oh, J.S.; Turner, B.; Hong, S.; Pitchiya, A.P.; Briggs, B.; Yang, J.; Yang, D.; Wang, F.; Lee, J.; Prabhu, G.; Ho, D.; Caballero, C.; Chaturvedula, D.; Yuan, Z.; Zheng, Y.; Britz, D.A.; Krause, S.; Sreenivasan, R.; Chudzik, M.; Kengeri, S.; Krishnan, S.; Bazizi, E.M.
In: Digest of Technical Papers - Symposium on VLSI Technology , 2024 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2024. (Digest of Technical Papers - Symposium on VLSI Technology, 2024)
Conference
Everaert, J-L.; Schaekers, M.; Yu, H.; Wang, L.-L.; Hikavyy, A.; Date, L.; del Agua Borniquel, J.; Hollar, K.; Khaja, F. A.; Aderhold, W.; Mayur, A. J.; Lee, J. Y.; van Meer, H.; Jiang, Y.-L.; De Meyer, K.; Mocuta, D.; Horiguchi, N.
2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T214-T215 Jun, 2017
Conference
2010 18th International Conference on Advanced Thermal Processing of Semiconductors (RTP) Advanced Thermal Processing of Semiconductors (RTP), 2010 18th International Conference on. :166-170 Sep, 2010
Conference
Wang, Lin-Lin; Yu, Hao; Schaekers, M.; Everaert, J.-L.; Franquet, A.; Douhard, B.; Date, L.; del Agua Borniquel, J.; Hollar, K.; Khaja, F. A.; Aderhold, W.; Mayur, A. J.; Lee, J. Y.; van Meer, H.; Mocuta, D.; Horiguchi, N.; Collaert, N.; De Meyer, K.; Jiang, Yu-Long
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :22.4.1-22.4.4 Dec, 2017
Conference
Yu, H.; Schaekers, M.; Hikavyy, A.; Rosseel, E.; Peter, A.; Hollar, K.; Khaja, F. A.; Aderhold, W.; Date, L.; Mayur, A. J.; Lee, J.-G.; Shin, K. M.; Douhard, B.; Chew, S. A.; Demuynck, S.; Kubicek, S.; Kim, D.; Mocuta, A.; Barla, K.; Horiguchi, N.; Collaert, N.; Thean, A.V.-Y.; De Meyer, K.
2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016
Conference
Date, L.; Rittersma, Z.M.; Massoubre, D.; Ponomarev, Y.; Roozeboom, F.; Pique, D.; van-Autryve, L.; Van Elshocht, S.; Caymax, M.
Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI. :133-136 2003
Conference
Heyns, M.; Beckx, S.; Bender, H.; Blomme, P.; Boullart, W.; Brijs, B.; Carter, R.; Caymax, M.; Claes, M.; Conard, T.; De Gendt, S.; Degraeve, R.; Delabie, A.; Deweerdt, W.; Groeseneken, G.; Henson, K.; Kauerauf, T.; Kubicek, S.; Lucci, L.; Lujan, G.; Mentens, J.; Pantisano, L.; Petry, J.; Richard, O.; Rohr, E.; Schram, T.; Vandervorst, W.; Van Doorne, P.; Van Elshocht, S.; Westlinder, J.; Witters, T.; Zhao, C.; Cartier, E.; Chen, J.; Cosnier, V.; Green, M.; Jang, S.E.; Kaushik, V.; Kerber, A.; Kluth, J.; Lin, S.; Tsai, W.; Young, E.; Manabe, Y.; Shimamoto, Y.; Bajolet, P.; De Witte, H.; Maes, J.W.; Date, L.; Pique, D.; Coenegrachts, B.; Vertommen, J.; Passefort, S.
2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 2003 International Symposium on. :247-250 2003
Conference
Veloso, A.; Cubaynes, F.N.; Rothschild, A.; Mertens, S.; Degraeve, R.; O'Connor, R.; Olsen, C.; Date, L.; Schaekers, M.; Dachs, C.; Jurczak, M.
ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :239-242 2003
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[AR] Daté, L.
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