학술논문
'학술논문'
에서 검색결과 17건 | 목록
1~10
Academic Journal
In: Journal of Electronic Testing: Theory and Applications (JETTA) . (Journal of Electronic Testing: Theory and Applications (JETTA), April 2024, 40(2):245-257)
Conference
Medeiros, G.C.; Fieback, M.; Copetti, T.S.; Gebregiorgis, A.; Taouil, M.; Poehls, L.B.; Hamdioui, S.
2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2021 16th International Conference on. :1-6 Jun, 2021
Conference
In: 2024 IEEE 25th Latin American Test Symposium, LATS 2024 , 2024 IEEE 25th Latin American Test Symposium, LATS 2024. (2024 IEEE 25th Latin American Test Symposium, LATS 2024, 2024)
Conference
Palermo, N.; Tihhomirov, V.; Copetti, T.S.; Jenihhin, M.; Raik, J.; Kostin, S.; Gaudesi, M.; Squillero, G.; Reorda, M.S.; Vargas, F.; Poehls, L.B.
2015 16th Latin-American Test Symposium (LATS) Test Symposium (LATS), 2015 16th Latin-American. :1-6 Mar, 2015
Conference
In: 2023 IEEE 24th Latin American Test Symposium, LATS 2023 , 2023 IEEE 24th Latin American Test Symposium, LATS 2023. (2023 IEEE 24th Latin American Test Symposium, LATS 2023, 2023)
Conference
In: 2022 IEEE 23rd Latin American Test Symposium, LATS 2022 , 2022 IEEE 23rd Latin American Test Symposium, LATS 2022. (2022 IEEE 23rd Latin American Test Symposium, LATS 2022, 2022)
Book
In: VLSI-SoC: Technology Advancement on SoC Design - 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, Revised and Extended Selected Papers . (IFIP Advances in Information and Communication Technology, 2022, 661 IFIP:93-111)
Academic Journal
Jenihhin, M.; Tihhomirov, V.; Kostin, S.; Raik, J.; Ubar, R.; Squillero, G.; Gaudesi, M.; Sonza Reorda, M.; Copetti, T.S.; Vargas, F.; Bolzani Poehls, L.; Medeiros, G.C.
In: Journal of Electronic Testing: Theory and Applications (JETTA) . (Journal of Electronic Testing: Theory and Applications (JETTA), 1 June 2016, 32(3):273-289)
Conference
In: 2021 IEEE 22nd Latin American Test Symposium, LATS 2021 , 2021 IEEE 22nd Latin American Test Symposium, LATS 2021. (2021 IEEE 22nd Latin American Test Symposium, LATS 2021, 2021)
Conference
In: IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC , Proceedings of the 2021 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021. (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC, 2021, 2021-October)
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제한된 항목
[AR] Copetti, T.S.
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